Threading dislocation density effect on the electrical and optical properties of InGaN light-emitting diodes

被引:11
|
作者
Dang, Suihu [1 ]
Li, Chunxia [1 ]
Lu, Mengchun [1 ]
Guo, Hongli [1 ]
He, Zelong [1 ]
机构
[1] Yangtze Normal Univ, Dept Elect & Informat Engn, Chongqing 408003, Peoples R China
来源
OPTIK | 2018年 / 155卷
基金
中国国家自然科学基金;
关键词
Threading dislocation; Internal quantum efficiency; Light-emitting diodes; GAN FILMS; SEMICONDUCTORS; SCATTERING; EFFICIENCY; NITRIDE; DEVICES; BLUE;
D O I
10.1016/j.ijleo.2017.10.096
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
The electrical and optical properties of InGaN LEDs with different threading dislocation densities (TDDs) were investigated. LEDs with low TDDs exhibited low forward voltage and high injection efficiency compared with LEDs with high TDDs. The effect of TDDs on the electrical properties of InGaN LEDs was attributed to efficient carrier injection into the QWs brought about by increased transverse carrier mobility in the InGaN layer resulting from reductions in carrier scattering" around dislocation cores. In terms of optical properties, LEDs with low TDDs exhibited high peak efficiency and substantial efficiency droops under increased current densities, whereas LEDs with high TDDs showed low peak efficiency and minimal droops under the same condition. These trends can be explained by the correlations of high TDDs with increased dominance of nonradiative recombination and pronounced suppression of peak efficiency under low current densities. (C) 2017 Elsevier GmbH. All rights reserved.
引用
收藏
页码:26 / 30
页数:5
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