Far-infrared reflection spectra of SmS polycrystals

被引：3

作者：

Ulashkevich, Yu. V. ^{[1
]}

Kaminskii, V. V. ^{[1
]}

Kazanin, M. M. ^{[1
]}

机构：

[1] Russian Acad Sci, AF Ioffe Phys Tech Inst, St Petersburg 194021, Russia

来源：

PHYSICS OF THE SOLID STATE | 2012年 / 54卷 / 11期

基金：

俄罗斯基础研究基金会;

关键词：

Reflection Spectrum; Lorentz Model; Complex Dielectric Function; Polar Optical Phonon; Free Electron Concentration;

D O I：

10.1134/S1063783412110303

中图分类号：

O469 [凝聚态物理学];

学科分类号：

070205 ;

摘要：

The reflection spectra of polycrystalline SmS samples have been measured in the far-infrared region within a broad temperature interval (293-80 K). Such measurements have been demonstrated to be efficient in the determination of the gradient in free electron concentration, an important aspect for the estimation of the magnitude of the thermovoltaic effect in a sample. DOI: 10.1134/S1063783412110303

引用

页码：2198 / 2200

页数：3

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