G2Way-A Backtracking Strategy for Pairwise Test Data Generation

被引:15
作者
Klaib, Mohammad F. J. [1 ]
Zamli, Kamal Z. [1 ]
Isa, Nor Ashidi M. [1 ]
Younis, Mohammed I. [1 ]
Abdullah, Rusli [2 ]
机构
[1] Univ Sains Malaysia, Sch Elect & Elect, Nibong Tebal 14300, Penang, Malaysia
[2] Univ Putra Malaysia, Fac Comp Sci & Informat Technol, Serdang 43400, Malaysia
来源
APSEC 2008:15TH ASIA-PACIFIC SOFTWARE ENGINEERING CONFERENCE, PROCEEDINGS | 2008年
关键词
D O I
10.1109/APSEC.2008.49
中图分类号
TP31 [计算机软件];
学科分类号
081202 ; 0835 ;
摘要
Our continuous dependencies on software (i.e. to assist as well as facilitate our daily chores) often raise dependability issue particularly when software is being employed harsh and life threatening or (safety) critical applications. Here, rigorous software testing becomes immensely important. Many combinations of possible input parameters, hardware/software environments, and system conditions need to be tested and verified against for conformance. Due to resource constraints as well as time and costing factors, considering all exhaustive test possibilities would be impossible (i.e. due to combinatorial explosion problem). Earlier work suggests that pairivise sampling strategy (i.e. based on two-way parameter interaction) can be effective. Building and complementing earlier work, this paper discusses an efficient pairivise test data generation strategy, called G2Way. In doing so, this paper demonstrates the correctness of G2Way as well as compares its effectiveness against existing strategies including AETG and its variations, IPO, SA, GA, ACA, and All Pairs. Empirical evidences demonstrate that G2Way, in some cases, outperfonned other strategies in terms of the number of generated test data within reasonable execution time.
引用
收藏
页码:463 / +
页数:2
相关论文
共 19 条
[1]  
Bach J, ALLPAIRS TEST CASE G
[2]   The AETG system: An approach to testing based on combinatorial design [J].
Cohen, DM ;
Dalal, SR ;
Fredman, ML ;
Patton, GC .
IEEE TRANSACTIONS ON SOFTWARE ENGINEERING, 1997, 23 (07) :437-444
[3]   The combinatorial design approach to automatic test generation [J].
Cohen, DM ;
Dalal, SR ;
Parelius, J ;
Patton, GC .
IEEE SOFTWARE, 1996, 13 (05) :83-88
[4]  
COHEN MB, 2004, THESIS U AUCKLAND
[5]  
Colbourn C. J., 2004, P IASTED INT C SOFTW, P242
[6]  
*EMMA, 2006, EMMA FREE JAV COD CO
[7]  
Grindal M., 2004, ISETR0405 GMU
[8]  
HARTMAN A, 2004, DISCRETE MATH JUL, P149
[9]   In-parameter-order: A test generation strategy for pairwise testing [J].
Lei, Y ;
Tai, KC .
THIRD IEEE INTERNATIONAL HIGH-ASSURANCE SYSTEMS ENGINEERING SYMPOSIUM, PROCEEDINGS, 1998, :254-261
[10]  
Lei Y, 2007, ECBS 2007: 14TH ANNUAL IEEE INTERNATIONAL CONFERENCE AND WORKSHOPS ON THE ENGINEERING OF COMPUTER-BASED SYSTEMS, PROCEEDINGS, P549