Studies of N-Doped p-ZnO Layers Grown on c-Sapphire by Radical Source Molecular Beam Epitaxy

被引:7
作者
Ivanov, S. V. [1 ]
El-Shafr, A. [1 ]
Al-Suleiman, M. [1 ]
Bakin, A. [1 ]
Waag, A. [1 ]
Lyublinskaya, O. G. [2 ]
Shmidt, N. M. [2 ]
Listoshin, S. B. [2 ]
Kyutt, R. N. [2 ]
Ratnikov, V. V. [2 ]
Terentyev, A. Ya. [2 ]
Ber, B. Ya. [2 ]
Komissarova, T. A. [3 ]
Ryabova, L. I. [3 ]
Khokhlov, D. R. [3 ]
机构
[1] Tech Univ Carolo Wilhelmina Braunschweig, Inst Semicond Technol, D-38106 Braunschweig, Germany
[2] Russian Acad Sci, AF Ioffe Physicotech Inst, St Petersburg 196140, Russia
[3] Moscow MV Lomonosov State Univ, Dept Phys, Moscow 119992, Russia
关键词
Molecular beam epitaxy; Plasma activated oxygen; Nitrogen; ZnO layers; p-doping;
D O I
10.3938/jkps.53.3016
中图分类号
O4 [物理学];
学科分类号
0702 ;
摘要
We report on the fabrication of p-type ZnO:N layers using radical-source molecular beam epitaxy and post-growth annealing of the samples. Plasma-activated oxygen and nitrogen fluxes are supplied via a single plasma cell. The combination of low growth temperature (350 - 400 degrees C), slightly O-rich conditions, and post-growth annealing in the range of 650 - 800 degrees C results in efficient nitrogen p-doping with Hall hole concentration 3 x 10(17) cm(-3). The details of the structural and the electrical characterizations of the films are discussed.
引用
收藏
页码:3016 / 3020
页数:5
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