Electron holography of magnetic field generated by a magnetic recording head

被引:4
作者
Goto, Takayuki [1 ]
Jeong, Jong Seok [1 ]
Xia, Weixing [1 ]
Akase, Zentaro [1 ]
Shindo, Daisuke [1 ]
Hirata, Kei [2 ]
机构
[1] Tohoku Univ, Inst Multidisciplinary Res Adv Mat, Sendai, Miyagi 9808577, Japan
[2] TDK Corp, Nagano 3858555, Japan
基金
日本学术振兴会;
关键词
magnetic recording head; magnetic field; transmission electron microscopy; electron holography; in situ observation; finite element method;
D O I
10.1093/jmicro/dfs090
中图分类号
TH742 [显微镜];
学科分类号
摘要
The magnetic field generated by a magnetic recording head is evaluated using electron holography. A magnetic recording head, which is connected to an electric current source, is set on the specimen holder of a transmission electron microscope. Reconstructed phase images of the region around the magnetic pole show the change in the magnetic field distribution corresponding to the electric current applied to the coil of the head. A simulation of the magnetic field, which is conducted using the finite element method, reveals good agreement with the experimental observations.
引用
收藏
页码:383 / 389
页数:7
相关论文
共 6 条
[1]   Analysis of magnetization in nanocomposite Nd4.5(Fe,Cr)77B18.5 by electron holography and simulation [J].
Aoyama, Y ;
Park, YG ;
Shindo, D .
JOURNAL OF ELECTRON MICROSCOPY, 2005, 54 (03) :279-286
[2]   Discoveries that guided the beginning of perpendicular magnetic recording [J].
Iwasaki, S .
JOURNAL OF MAGNETISM AND MAGNETIC MATERIALS, 2001, 235 (1-3) :227-234
[3]   Magnetic domain observation in writer pole tip for perpendicular recording head by electron holography [J].
Kim, J. J. ;
Hirata, K. ;
Ishida, Y. ;
Shindo, D. ;
Takahashi, M. ;
Tonomura, A. .
APPLIED PHYSICS LETTERS, 2008, 92 (16)
[4]  
Matteucci G., 1997, SCANNING MICROSCOPY, V11, P367
[5]  
SHINDO D, 2008, J PHYS D, V41, P1
[6]   Quantitative evaluation of magnetic flux density in a magnetic recording head and pseudo soft underlayer by electron holography [J].
Xia, Weixing ;
Hirata, Kei ;
Yanagisawa, Keiichi ;
Ishida, Yoichi ;
Kasai, Hiroto ;
Yanagiuchi, Katsuaki ;
Shindo, Daisuke ;
Tonomura, Akira .
JOURNAL OF ELECTRON MICROSCOPY, 2010, 59 (05) :331-337