Optical axis misalignment detection by noncollinear second-harmonic generation

被引：2

作者：

Bovino, F. A. ^{[1
]}

Tasco, V. ^{[2
]}

Passaseo, A. ^{[2
]}

Larciprete, M. C. ^{[3
]}

Belardini, A. ^{[3
]}

Sibilia, C. ^{[3
]}

机构：

[1] Selex ES, Quantum Opt Lab, I-16154 Genoa, Italy

[2] CNR Nano, Natl Nanotechnol Lab, I-73100 Lecce, Italy

[3] Univ Roma La Sapienza, Dipartimento SBAI, I-00161 Rome, Italy

来源：

JOURNAL OF THE OPTICAL SOCIETY OF AMERICA B-OPTICAL PHYSICS | 2014年 / 31卷 / 01期

关键词：

SILICON-CARBIDE; THIN-FILMS; GAN; SUSCEPTIBILITY; CRYSTALS; 4H;

D O I：

10.1364/JOSAB.31.000026

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

The polarization scan of both pumps in a noncollinear second-harmonic experiment is shown to be a powerful tool for identifying the different components of plane misalignment angles in a nonlinear crystal. Here, we report an optical axis misalignment as small as 1 degrees, in a 380 mu m thick 4H-SiC sample, by means of 130 fs pulsed laser of 830 nm wavelength. The optical axis misalignment is confirmed by the x-ray structural analysis. (C) 2013 Optical Society of America

引用

页码：26 / 32

页数：7

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