Gauging contact line friction of droplets: In situ measurement within a digital microsystem

被引：5

作者：

Theisen, Johannes ^{[2
]}

Davoust, Laurent ^{[1
]}

机构：

[1] Grenoble Inst Technol Grenoble INP, Mat & Proc Sci & Engn Lab SIMAP, F-38402 St Martin Dheres, France

[2] Univ Grenoble UJF, Lab Geophys & Ind Fluid Flows LEGI, F-38400 St Martin Dheres, France

来源：

MICROELECTRONIC ENGINEERING | 2012年 / 98卷

关键词：

Electrohydrodynamics; Contact line friction; Interferometry; Digital microfluidics; Dual-frequency electrowetting; EWOD; Ageing; ELECTROWETTING ACTUATION; DYNAMICS;

D O I：

10.1016/j.mee.2012.06.018

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

Here is presented an interferometry technique to quantify damping of electrowetting induced shape oscillations of a sessile microdrop. This characterization method and its devoted chip can be inserted into a microsystem to quantify contact line friction and hence surface ageing in digital electrowetting applications (lab-on-chips, microfluidic lenses and displays). Here, the contact line friction is proposed as a criteria to distinguish sensor surfaces contaminated by adsorbed bio-molecules. (C) 2012 Elsevier B.V. All rights reserved.

引用

页码：680 / 683

页数：4

共 16 条

[1] Dynamics of Droplet Motion under Electrowetting Actuation [J].