Modelling, calibration and correction of nonlinear illumination-dependent fixed pattern noise in logarithmic CMOS image sensors

被引:0
|
作者
Joseph, D [1 ]
Collins, S [1 ]
机构
[1] Univ Oxford, Dept Engn Sci, Oxford OX1 3PJ, England
来源
IMTC/2001: PROCEEDINGS OF THE 18TH IEEE INSTRUMENTATION AND MEASUREMENT TECHNOLOGY CONFERENCE, VOLS 1-3: REDISCOVERING MEASUREMENT IN THE AGE OF INFORMATICS | 2001年
关键词
CMOS image sensors; logarithmic pixels; fixed pattern noise;
D O I
暂无
中图分类号
TP18 [人工智能理论];
学科分类号
081104 ; 0812 ; 0835 ; 1405 ;
摘要
(A)t present, most CMOS image sensors use an array of pixels with a linear response. However, logarithmic CMOS sensors are also possible, which are capable of imaging high dynamic range scenes without saturating. Unfortunately, logarithmic sensors suffer from fixed pattern noise (FPN). Work reported in the literature generally assumes the FPN is independent of illumination. This paper develops a nonlinear model y = a + b1n (c + x) of the pixel response y to an illuminance x showing that FPN arises from variation of the offset a, gain b and bias c. Equations are derived, which can be used to extract these parameters by calibration against a uniform illuminance of varying intensity. Experimental results, demonstrating parameter calibration and FPN correction, show that the nonlinear model outperforms previous models that assume either only offset or offset and gain variation.
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页码:1296 / 1301
页数:4
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