Computer-aided interferometer for testing microdisplacement of piezoelectric ceramics

被引:0
|
作者
Zhu, Y [1 ]
Chen, JB [1 ]
Wang, Q [1 ]
Chen, L [1 ]
Zhu, RH [1 ]
机构
[1] Nanjing Univ Sci & Technol, Sch Electroopt, Nanjing 210094, Peoples R China
关键词
contact-type interferometer; computer-aided interferometry; piezoelectric ceramics;
D O I
暂无
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
This paper proposes a kind of computer-aided contact-type interferometer for testing the microdisplacement of piezoelectric ceramics (PZT). Its accuracy is better than 0.01 mu m. A data acquisition system, including a CCD, grabber, etc., has been used to detect and digitize interferograms. This system analyzes a two-dimensional interferogram automatically and quickly, while both calibrate with monochromatic fringes and test with achromatic fringes. Software has been used to analyze the two-dimensional interferogram and to rest the nonlinearity and hysteresis of PZT. (C) 1999 John Wiley & Sons, Inc.
引用
收藏
页码:72 / 74
页数:3
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