Investigation of Influence of Measurement Conditions on Accuracy of Material Characterization in sub-THz Frequency Range

被引：0
|
作者：
Godziszewski, Konrad [1 ]
Yashchyshyn, Yevhen [1 ]
机构：
[1] Warsaw Univ Technol, Inst Radioelect & Multimedia Technol, Warsaw, Poland
来源：
2016 21ST INTERNATIONAL CONFERENCE ON MICROWAVE, RADAR AND WIRELESS COMMUNICATIONS (MIKON) | 2016年
关键词：
material characterization; sub-THz range; multilayer structures; LTCC;
D O I：
暂无
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
In this paper results of investigations of the influence of measurement conditions on the accuracy of material characterization in sub-THz range were presented. Different fabrication issues as well as metrological aspects were taken into account. Studies were focused on LTCC materials as emerging technology that can be used in developing of multilayer sub-terahertz devices. Simulation and experimental studies showed that appropriate preparation of measurement setup and samples under test are key elements to achieve high measurement accuracy.
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页数：4
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