Atomic Force Microscopy Breaking Through the Vertical Range-Bandwidth Tradeoff

被引:12
作者
Ito, Shingo [1 ]
Poik, Mathias [1 ]
Schlarp, Johannes [1 ]
Schitter, Georg [1 ]
机构
[1] TU Wien, Automat & Control Inst ACIN, A-1040 Vienna, Austria
关键词
Atomic force microscopy (AFM); design for control (DFC); mechatronics; nanopositioning; precision engineering; MECHANICAL-PROPERTIES; VIBRATION ISOLATION; DESIGN; SYSTEM;
D O I
10.1109/TIE.2020.2982113
中图分类号
TP [自动化技术、计算机技术];
学科分类号
0812 ;
摘要
This article proposes a mechatronic system design for atomic force microscopes (AFMs) in order to realize a large range and high control bandwidth of the vertical probe motion by a flexure-guided voice coil actuator. The first mechanical resonant frequency of the actuator is decreased to 67 Hz for a large motion, whereas the second resonant frequency is maximized to 1.15 kHz. The frequency band between the resonances enables two-degree-of-freedom control with a position sensor to realize a control bandwidth of 881 Hz, which is 13 times higher than the first resonance that is the limitation of conventional AFMs. The closed-loop actuator achieves a positioning resolution of 1.7 nm and a nonlinearity of 0.02% for a motion range of 700 mu m. Consequently, the actuator realizes a range-bandwidth product of 617 kHz.mu m, breaking through a theoretical limit of piezoelectric actuators (567 kHz.mu m). The high performance of the actuator is further confirmed by 400 mu m topography measurement in the constant force mode with a bandwidth of 197 Hz. The achieved resolution of the topography measurement is 2.9 nm, and it is demonstrated by successfully imaging nanostructures on a CD-ROM disk.
引用
收藏
页码:786 / 795
页数:10
相关论文
共 43 条
[31]   An Integrated Magnetic Actuation System for High-Speed Atomic Force Microscopy [J].
Sriramshankar, R. ;
Jayanth, G. R. .
IEEE-ASME TRANSACTIONS ON MECHATRONICS, 2018, 23 (05) :2285-2294
[32]   Six Degree of Freedom Vibration Isolation Platform for In-Line Nano-Metrology [J].
Thier, Markus ;
Saathof, Rudolf ;
Sinn, Andreas ;
Hainisch, Reinhard ;
Schitter, Georg .
IFAC PAPERSONLINE, 2016, 49 (21) :149-156
[33]   Mechanical properties of components fabricated with open-source 3-D printers under realistic environmental conditions [J].
Tymrak, B. M. ;
Kreiger, M. ;
Pearce, J. M. .
MATERIALS & DESIGN, 2014, 58 :242-246
[34]   Development of a Compact Atomic Force Microscope Based on an Optical Pickup Head [J].
Unger, Severin ;
Ito, Shingo ;
Kohl, Dominik ;
Schitter, Georg .
IFAC PAPERSONLINE, 2016, 49 (21) :629-635
[35]  
VANDEVEGTE J, 1994, FEEDBACK CONTROL SYS
[36]   First results from the Large dynamic range Atomic Force Microscope for overlay metrology [J].
Witvoet, G. ;
Peters, J. ;
Kuiper, S. ;
Keyvani, A. ;
Willekers, R. .
METROLOGY, INSPECTION, AND PROCESS CONTROL FOR MICROLITHOGRAPHY XXXIII, 2019, 10959
[37]  
Xie H, 2020, IEEE T IND ELECTRON, V67, P2430, DOI 10.1109/TIE.2019.2902792
[38]   Design and Development of a Flexure-Based Dual-Stage Nanopositioning System With Minimum Interference Behavior [J].
Xu, Qingsong .
IEEE TRANSACTIONS ON AUTOMATION SCIENCE AND ENGINEERING, 2012, 9 (03) :554-563
[39]   In-line metrology of nanoscale features in semiconductor manufacturing systems [J].
Yao, Tsung-Fu ;
Duenner, Andrew ;
Cullinan, Michael .
PRECISION ENGINEERING-JOURNAL OF THE INTERNATIONAL SOCIETIES FOR PRECISION ENGINEERING AND NANOTECHNOLOGY, 2017, 47 :147-157
[40]   A charge controller for linear operation of a piezoelectric stack actuator [J].
Yi, KA ;
Veillette, RJ .
IEEE TRANSACTIONS ON CONTROL SYSTEMS TECHNOLOGY, 2005, 13 (04) :517-526