Atomic Force Microscopy Breaking Through the Vertical Range-Bandwidth Tradeoff

被引:12
作者
Ito, Shingo [1 ]
Poik, Mathias [1 ]
Schlarp, Johannes [1 ]
Schitter, Georg [1 ]
机构
[1] TU Wien, Automat & Control Inst ACIN, A-1040 Vienna, Austria
关键词
Atomic force microscopy (AFM); design for control (DFC); mechatronics; nanopositioning; precision engineering; MECHANICAL-PROPERTIES; VIBRATION ISOLATION; DESIGN; SYSTEM;
D O I
10.1109/TIE.2020.2982113
中图分类号
TP [自动化技术、计算机技术];
学科分类号
0812 ;
摘要
This article proposes a mechatronic system design for atomic force microscopes (AFMs) in order to realize a large range and high control bandwidth of the vertical probe motion by a flexure-guided voice coil actuator. The first mechanical resonant frequency of the actuator is decreased to 67 Hz for a large motion, whereas the second resonant frequency is maximized to 1.15 kHz. The frequency band between the resonances enables two-degree-of-freedom control with a position sensor to realize a control bandwidth of 881 Hz, which is 13 times higher than the first resonance that is the limitation of conventional AFMs. The closed-loop actuator achieves a positioning resolution of 1.7 nm and a nonlinearity of 0.02% for a motion range of 700 mu m. Consequently, the actuator realizes a range-bandwidth product of 617 kHz.mu m, breaking through a theoretical limit of piezoelectric actuators (567 kHz.mu m). The high performance of the actuator is further confirmed by 400 mu m topography measurement in the constant force mode with a bandwidth of 197 Hz. The achieved resolution of the topography measurement is 2.9 nm, and it is demonstrated by successfully imaging nanostructures on a CD-ROM disk.
引用
收藏
页码:786 / 795
页数:10
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