Sequential Brush Grafting for Chemically and Dimensionally Tolerant Directed Self-Assembly of Block Copolymers
被引:4
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作者:
Chang, Boyce S.
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机构:
Lawrence Berkeley Natl Lab, Mol Foundry, Berkeley, CA 94720 USALawrence Berkeley Natl Lab, Mol Foundry, Berkeley, CA 94720 USA
Chang, Boyce S.
[1
]
Loo, Whitney S.
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机构:
Univ Chicago, Pritzker Sch Mol Engn, Chicago, IL 60637 USALawrence Berkeley Natl Lab, Mol Foundry, Berkeley, CA 94720 USA
Loo, Whitney S.
[2
]
Yu, Beihang
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机构:
Lawrence Berkeley Natl Lab, Mol Foundry, Berkeley, CA 94720 USALawrence Berkeley Natl Lab, Mol Foundry, Berkeley, CA 94720 USA
Yu, Beihang
[1
]
Dhuey, Scott
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机构:
Lawrence Berkeley Natl Lab, Mol Foundry, Berkeley, CA 94720 USALawrence Berkeley Natl Lab, Mol Foundry, Berkeley, CA 94720 USA
Dhuey, Scott
[1
]
Wan, Lei
论文数: 0引用数: 0
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机构:
Western Digital, San Jose, CA 95119 USALawrence Berkeley Natl Lab, Mol Foundry, Berkeley, CA 94720 USA
Wan, Lei
[3
]
Nealey, Paul F.
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机构:
Lawrence Berkeley Natl Lab, Mol Foundry, Berkeley, CA 94720 USA
Univ Chicago, Pritzker Sch Mol Engn, Chicago, IL 60637 USA
Mat Sci Div, Argonne Natl Lab, Lemont, IL 60439 USALawrence Berkeley Natl Lab, Mol Foundry, Berkeley, CA 94720 USA
Nealey, Paul F.
[1
,2
,4
]
Ruiz, Ricardo
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机构:
Lawrence Berkeley Natl Lab, Mol Foundry, Berkeley, CA 94720 USALawrence Berkeley Natl Lab, Mol Foundry, Berkeley, CA 94720 USA
Ruiz, Ricardo
[1
]
机构:
[1] Lawrence Berkeley Natl Lab, Mol Foundry, Berkeley, CA 94720 USA
[2] Univ Chicago, Pritzker Sch Mol Engn, Chicago, IL 60637 USA
[3] Western Digital, San Jose, CA 95119 USA
[4] Mat Sci Div, Argonne Natl Lab, Lemont, IL 60439 USA
directed self-assembly;
block copolymer;
thin films;
advanced lithography;
defectivity;
LINE EDGE ROUGHNESS;
DENSITY MULTIPLICATION;
PATTERNS;
FABRICATION;
DESIGN;
D O I:
10.1021/acsami.2c16508
中图分类号:
TB3 [工程材料学];
学科分类号:
0805 ;
080502 ;
摘要:
We report a method for the directed self-assembly (DSA) of block copolymers (BCPs) in which a first BCP film deploys homopolymer brushes, or "inks", that sequentially graft onto the substrate's surface via the interpenetration of polymer molecules during the thermal annealing of the polymer film on top of existing polymer brushes. By selecting polymer "inks" with the desired chemistry and appropriate relative molecular weights, it is possible to use brush interpenetration as a powerful technique to generate self-registered chemical contrast patterns at the same frequency as that of the domains of the BCP. The result is a process with a higher tolerance to dimensional and chemical imperfections in the guiding patterns, which we showcase by implementing DSA using homopolymer brushes for the guiding features as opposed to more robust cross-linkable mats. We find that the use of "inks" does not compromise the line width roughness, and the quality of the DSA as a lithographic mask is verified by implementing a robust "dry lift-off" pattern transfer.
机构:
Intel Corp, 2501 NE Century Blvd, Hillsboro, OR 97124 USA
Univ Chicago, Inst Mol Engn, 5640 S Ellis Ave, Chicago, IL 60637 USAIntel Corp, 2501 NE Century Blvd, Hillsboro, OR 97124 USA
Chen, Xuanxuan
Delgadillo, Paulina R.
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机构:
Univ Chicago, Inst Mol Engn, 5640 S Ellis Ave, Chicago, IL 60637 USA
Imec, Kapeldreef 75, B-3001 Leuven, BelgiumIntel Corp, 2501 NE Century Blvd, Hillsboro, OR 97124 USA
Delgadillo, Paulina R.
Jiang, Zhang
论文数: 0引用数: 0
h-index: 0
机构:
Argonne Natl Lab, Xray Sci Div, 9700 South Cass Ave, Argonne, IL 60439 USAIntel Corp, 2501 NE Century Blvd, Hillsboro, OR 97124 USA
Jiang, Zhang
Craig, Gordon S. W.
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h-index: 0
机构:
Univ Chicago, Inst Mol Engn, 5640 S Ellis Ave, Chicago, IL 60637 USAIntel Corp, 2501 NE Century Blvd, Hillsboro, OR 97124 USA
Craig, Gordon S. W.
Gronheid, Roel
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h-index: 0
机构:
Imec, Kapeldreef 75, B-3001 Leuven, BelgiumIntel Corp, 2501 NE Century Blvd, Hillsboro, OR 97124 USA
Gronheid, Roel
Nealey, Paul F.
论文数: 0引用数: 0
h-index: 0
机构:
Univ Chicago, Inst Mol Engn, 5640 S Ellis Ave, Chicago, IL 60637 USA
Argonne Natl Lab, Mat Sci Div, 9700 South Cass Ave, Lemont, IL 60439 USAIntel Corp, 2501 NE Century Blvd, Hillsboro, OR 97124 USA