Theoretical and experimental developments in the determination of electron energy loss functions and inelastic mean free paths in elemental solids and binary compounds

被引：0

作者：

Bourke, Jay D. ^{[1
]}

Chantler, Christopher T. ^{[1
]}

机构：

[1] Univ Melbourne, Sch Phys, Melbourne, Vic 3010, Australia

来源：

XXVII INTERNATIONAL CONFERENCE ON PHOTONIC, ELECTRONIC AND ATOMIC COLLISIONS (ICPEAC 2011), PTS 1-15 | 2012年 / 388卷

关键词：

D O I：

10.1088/1742-6596/388/13/132008

中图分类号：

O64 [物理化学（理论化学）、化学物理学]; O56 [分子物理学、原子物理学];

学科分类号：

070203 ; 070304 ; 081704 ; 1406 ;

摘要：

We present a new theoretical representation of the electron energy loss function in terms of partial plasmon poles. This representation allows the determination of electron inelastic mean free paths from a known optical spectrum without empirical fitting, and for the first time, with consistent fulfilment of optical sum rules. We compare the new theory to recent experimental determinations of the inelastic mean free path and demonstrate in p roved agreement.

引用

页数：1

共 9 条

[1] Finite difference method calculations of X-ray absorption fine structure for copper [J].

Bourke, J. D. ;

Chantler, C. T. ;

Witte, C. .

PHYSICS LETTERS A, 2007, 360 (06) :702-706

[2] Measurements of Electron Inelastic Mean Free Paths in Materials [J].

Bourke, J. D. ;

Chantler, C. T. .

PHYSICAL REVIEW LETTERS, 2010, 104 (20)

[3]

Bourke J. D., 2011, PHYS REV LETT UNPUB

[4] X-ray Spectroscopic Measurement of Photoelectron Inelastic Mean Free Paths in Molybdenum [J].

Chantler, Christopher T. ;

Bourke, Jay D. .

JOURNAL OF PHYSICAL CHEMISTRY LETTERS, 2010, 1 (15) :2422-2427

[5]

Cumpson PJ, 1997, SURF INTERFACE ANAL, V25, P447, DOI 10.1002/(SICI)1096-9918(199706)25:6<447::AID-SIA272>3.0.CO

[6]

2-Q

[7] Element-selective imaging of atomic columns in a crystal using STEM and EELS [J].

Kimoto, Koji ;

Asaka, Toru ;

Nagai, Takuro ;

Saito, Mitsuhiro ;

Matsui, Yoshio ;

Ishizuka, Kazuo .

NATURE, 2007, 450 (7170) :702-704

[8] Atomic-scale chemical imaging of composition and bonding by aberration-corrected microscopy [J].

Muller, D. A. ;

Kourkoutis, L. Fitting ;

Murfitt, M. ;

Song, J. H. ;

Hwang, H. Y. ;

Silcox, J. ;

Dellby, N. ;

Krivanek, O. L. .

SCIENCE, 2008, 319 (5866) :1073-1076

[9] Emission-depth-selective Auger photoelectron coincidence spectroscopy -: art. no. 038302 [J].

Werner, WSM ;

Smekal, W ;

Störi, H ;

Winter, H ;

Stefani, G ;

Ruocco, A ;

Offi, F ;

Gotter, R ;

Morgante, A ;

Tommasini, F .

PHYSICAL REVIEW LETTERS, 2005, 94 (03)

← 1 →