Radiated electric field strength from high-power microwave systems

被引：13

作者：

Larsson, Anders ^{[1
,2
]}

Johansson, Bo ^{[3
]}

Nyholm, Sten E. ^{[1
]}

机构：

[1] Swedish Def Res Agcy FOI, Grindsjon Res Ctr, SE-14725 Tumba, Sweden

[2] Uppsala Univ, Div Elect, SE-75121 Uppsala, Sweden

[3] Swedish Armed Forces, S-10785 Stockholm, Sweden

来源：

IEEE TRANSACTIONS ON ELECTROMAGNETIC COMPATIBILITY | 2008年 / 50卷 / 03期

关键词：

high-power microwave; intentional electromagnetic interference (IEMI); microwave breakdown; microwave propagation; waveguide;

D O I：

10.1109/TEMC.2008.927920

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

Intentional electromagnetic interference (IEMI) is an emerging threat and a new electromagnetic environment that has to be considered in the mitigation of electromagnetic compatibility problems. This paper presents an attempt to estimate the upper limitations of IEMI systems based on high-power microwave devices. The upper limit of transmitted electromagnetic wave power is basically set by the microwave breakdown event. The estimate includes the properties of the electromagnetic wave propagation from the generation of the wave to the possible target.

引用

页码：758 / 761

页数：4

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