Properties of Nd-doped Bi4Ti3O12 thin films grown by metalorganic solution decomposition

被引：5

作者：

Yang, CH ^{[1
]}

Wang, Z ^{[1
]}

Zhai, JP ^{[1
]}

Ma, GP ^{[1
]}

Sun, XQ ^{[1
]}

Yi, XJ ^{[1
]}

Han, JR ^{[1
]}

机构：

[1] Shandong Univ, State Key Lab Crystal Mat, Jinan 250100, Peoples R China

来源：

JOURNAL OF CRYSTAL GROWTH | 2004年 / 264卷 / 1-3期

基金：

中国国家自然科学基金;

关键词：

atomic force microscopy; perovskites; dielectric materials;

D O I：

10.1016/j.jcrysgro.2004.01.002

中图分类号：

O7 [晶体学];

学科分类号：

0702 ; 070205 ; 0703 ; 080501 ;

摘要：

Neodymium-doped Bi4Ti3O12 (Bi3.15Nd0.85Ti3O12) films have been synthesized by metalorganic solution decomposition method and deposited on SiO2/p-Si(111) substrate by spin coating. The structural characteristic and crystallization of the films were examined by X-ray diffraction. The surface morphology and quality were studied using atomic force microscope. The films exhibit good insulating property and resistance to breakdown. The clockwise hysteresis curve is referred to as polarization type switching, and the memory window is about 2.5V. The dielectric constant and dissipation factor at a frequency of 100kHz are 110 and 0.137, respectively, at room temperature. (C) 2004 Elsevier B.V. All rights reserved.

引用

页码：312 / 315

页数：4

共 15 条

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