Measurements of complex permittivity at millimeter-wave frequencies with an end-loaded cavity resonator

被引:22
作者
Yoshikawa, Hiromichi [1 ]
Nakayama, Akira [1 ]
机构
[1] Kyocera Corp, Ctr Corp Res & Dev, Kirishima Shi, Kagoshima 8994312, Japan
关键词
cavity resonator; complex permittivity; dielectric property; measurement method; millimeter wave;
D O I
10.1109/TMTT.2008.927410
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
A novel cavity resonator method is proposed for measuring the complex permittivity of a dielectric plate in the millimeter-wave region. In this method, the dielectric plate is loaded at the end of the cavity resonator. The relative permittivity epsilon' and loss tangent tan delta are determined from measured resonant frequency and unloaded Q of the TE011 mode. This structure prevents excessive lowering of the resonant frequency due to the placement of the dielectric plate sample in the cavity. The suppression of spurious modes and the design of the cavity resonator are discussed. The values of epsilon' and tan delta were measured in the millimeter-wave range for low-temperature co-fired ceramic (LTCC), Al2O3, and sapphire plates. The temperature dependence of the comp per mittivity of the LTCC plate was measured at 34 GHz. The measurement accuracies are estimated to be within 0.6% for epsilon', and within 10% for tan delta of 10(-3).
引用
收藏
页码:2001 / 2007
页数:7
相关论文
共 21 条
[2]   EXPERIMENTAL-OBSERVATION OF FUNDAMENTAL MICROWAVE-ABSORPTION IN HIGH-QUALITY DIELECTRIC CRYSTALS [J].
BRAGINSKY, VB ;
ILCHENKO, VS ;
BAGDASSAROV, KS .
PHYSICS LETTERS A, 1987, 120 (06) :300-305
[3]  
Cook R. J., 1972, HIGH FREQUENCY DIELE, P12
[4]  
COQUET P, 1995, IEICE T ELECTRON, VE78C, P1125
[5]   ACCURATE MEASUREMENT OF PERMITTIVITY BY MEANS OF AN OPEN RESONATOR [J].
CULLEN, AL ;
YU, PK .
PROCEEDINGS OF THE ROYAL SOCIETY OF LONDON SERIES A-MATHEMATICAL AND PHYSICAL SCIENCES, 1971, 325 (1563) :493-&
[6]   A tunable split resonator method for nondestructive permittivity characterization [J].
Fang, XY ;
Linton, D ;
Walker, C ;
Collins, B .
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 2004, 53 (06) :1473-1478
[7]  
Janezic M. D., 2004, IEEE MTT S INT MICR, P1817
[8]   Nondestructive permittivity measurement of substrates [J].
Kent, G .
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 1996, 45 (01) :102-106
[9]   The gap correction for the resonant-mode dielectrometer [J].
Kent, G ;
Bell, SM .
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 1996, 45 (01) :98-101
[10]   AN EVANESCENT-MODE TESTER FOR CERAMIC DIELECTRIC SUBSTRATES [J].
KENT, G .
IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES, 1988, 36 (10) :1451-1454