TEM microstructural analysis in a fault gouge sample of the Nojima Fault Zone, Japan

被引：18
|
作者：
Janssen, Christoph [1 ]
Wirth, Richard [1 ]
Lin, Aiming [2 ]
Dresen, Georg [1 ]
机构：
[1] GeoForschungsZentrum Potsdam GFZ, D-14473 Potsdam, Germany
[2] Kyoto Univ, Dept Geophys, Kyoto 6068502, Japan
来源：
TECTONOPHYSICS | 2013年 / 583卷
关键词：
TEM analysis; Fault gouge; Amorphous material; Smectite; FISSION-TRACK ANALYSIS; ION-BEAM FIB; CATACLASTIC ROCKS; AWAJI ISLAND; DRILL CORE; SMECTITE; GLASS;
D O I：
10.1016/j.tecto.2012.10.020
中图分类号：
P3 [地球物理学]; P59 [地球化学];
学科分类号：
0708 ; 070902 ;
摘要：
A fault gouge sample, recovered from 389 m depth of the Disaster Prevention Research Institute (DPRI) 500 m bore hole of the Nojima fault, which triggered the 1995 M7.3 Kobe earthquake, was examined with transmission electron microscopy (TEM). We observed different types of amorphous material containing tiny flakes of crystalline phases. TEM-EDX analysis of the matrix indicates a pure smectite composition suggesting that matrix and crystalline flakes have the same composition. The detection of tiny crystalline flakes in the amorphous material may confirm previous assumption from the alteration of pseudotachylyte into smectite in fault rocks. (C) 2012 Elsevier B.V. All rights reserved.
引用
收藏
页码：101 / 104
页数：4
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