Sagnac interferometer for photothermal deflection spectroscopy

被引：9

作者：

Shiokawa, Naoyuki ^{[1
]}

Mizuno, Yuki ^{[1
]}

Tsuchiya, Harumasa ^{[1
]}

Tokunaga, Eiji ^{[1
,2
]}

机构：

[1] Tokyo Univ Sci, Dept Phys, Fac Sci, Shinjuku Ku, Tokyo 1628601, Japan

[2] Tokyo Univ Sci, Res Ctr Green & Safety Sci, Shinjuku Ku, Tokyo 1628601, Japan

来源：

OPTICS LETTERS | 2012年 / 37卷 / 13期

关键词：

SEMICONDUCTOR;

D O I：

10.1364/OL.37.002655

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

Photothermal deflection spectroscopy is combined with a Sagnac interferometer to enhance the sensitivity of the absorption measurement by converting the photothermal beam deflection effect into the light intensity change by the interference effect. Because of stable light interference due to the common path, the signal intensity can be amplified without increasing the noise by extending the optical path length between a sample and a photodetector. The sensitivity is further improved by the use of focusing optics and double-pass geometry. This makes photothermal deflection spectroscopy applicable to any kind of material in the whole visible region with a xenon lamp for excitation and water or air as a deflection medium. (C) 2012 Optical Society of America

引用

页码：2655 / 2657

页数：3

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