The effect of different strengths of extremely low-frequency electric fields on antioxidant status, lipid peroxidation, and visual evoked potentials

被引:15
作者
Akpinar, Deniz
Ozturk, Nihal
Ozen, Sukru [2 ]
Agar, Aysel [3 ]
Yargicoglu, Piraye [1 ]
机构
[1] Akdeniz Univ, Fac Med, Dept Biophys, TR-07070 Antalya, Turkey
[2] Akdeniz Univ, Dept Elect & Elect Engn, TR-07070 Antalya, Turkey
[3] Akdeniz Univ, Dept Physiol, TR-07070 Antalya, Turkey
关键词
Extremely Low Frequency Electric Field; Visual Evoked Potential; Thiobarbituric Acid Reactive Substances; Total Antioxidant Status; Total Oxidant Status; CHRONIC RESTRAINT STRESS; OXIDATIVE DNA-DAMAGE; RAT-BRAIN; MAGNETIC-FIELDS; ELECTROMAGNETIC-FIELDS; IMMOBILIZATION STRESS; GUINEA-PIGS; VITAMIN-E; IN-VIVO; VEPS;
D O I
10.3109/15368378.2012.692342
中图分类号
Q [生物科学];
学科分类号
07 ; 0710 ; 09 ;
摘要
The aim of the study was to investigate the effects of extremely low-frequency electric field (ELF EF) on visual evoked potential (VEP), thiobarbituric acid reactive substances (TBARS), total antioxidant status (TAS), total oxidant status (TOS), and oxidant stress index (OSI). Thirty female Wistar rats, aged 3 months, were divided into three equal groups: Control (C), the group exposed to EF at 12 kV/m strength (E12), and the group exposed to EF at 18 kV/m strength (E18). Electric field was applied to the E12 and E18 groups for 14 days (1 h/day). Brain and retina TBARS, TOS, and OSI were significantly increased in the E12 and E18 groups with respect to the control group. Also, TBARS levels were significantly increased in the E18 group compared with the E12 group. Electric fields significantly decreased TAS levels in both brain and retina in E12 and E18 groups with respect to the control group. All VEP components were significantly prolonged in rats exposed to electric fields compared to control group. In addition, all latencies of VEP components were increased in the E18 group with respect to the E12 group. It is conceivable to suggest that EF-induced lipid peroxidation may play an important role in changes of VEP parameters.
引用
收藏
页码:436 / 448
页数:13
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