Electron emission and surface etching by slow and medium highly charged ions on HOPG surface

被引：7

作者：

Wang, Yuyu ^{[1
]}

Sun, Jianrong ^{[1
]}

Zhao, Yongtao ^{[1
]}

Cheng, Rui ^{[1
]}

Ren, Jieru ^{[1
,2
]}

Yu, Yang ^{[1
,2
]}

Zhou, Xianming ^{[1
]}

Lei, Yu ^{[1
]}

Wang, Xing ^{[1
]}

Li, Yongfeng ^{[1
,2
]}

Xiao, Guoqing ^{[1
]}

机构：

[1] Chinese Acad Sci, Inst Modern Phys, Lanzhou 730000, Peoples R China

[2] Univ Chinese Acad Sci, Beijing 100049, Peoples R China

来源：

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS | 2013年 / 317卷

基金：

中国国家自然科学基金; 中国科学院西部之光基金;

关键词：

Highly charged ions; Electron emission; Surface nanostructuring; HOPG; SEPARATION; IMPACT;

D O I：

10.1016/j.nimb.2013.04.024

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

Highly charged (Xe-129(q+), q = 10-30) ion-induced secondary electron emission and formation of nanostructure on the surface of highly oriented pyrolytic graphite (HOPG) have been studied on the 320 kV ECR platform for Highly Charged Ion Beam at IMP-CAS, Lanzhou. The experimental data of the total secondary electron yields are used to separate contributions of kinetic and potential electron yields. The estimated kinetic electron yields are about 17 and 35 electron/ion by ions with kinetic energies of 600 keV and 5 MeV, respectively. The potential electron yield increases linearly with increasing potential energy of the incident ion. The total electron yield, however, does not depend significantly on kinetic energy. AFM analysis of the HOPG surface bombarded with Xe30+ ions revealed regular hillock like nanostructure. The relationship between hillock size (height and width) and ion's energy (including potential energy and kinetic energy) shows the same trend with the total electron yield which increases with potential energy and is independent on incident kinetic energy. (C) 2013 Elsevier B.V. All rights reserved.

引用

页码：33 / 36

页数：4

共 16 条

[1]

Arnau A., 1997, Surface Science Reports, V27, P113, DOI 10.1016/S0167-5729(97)00002-2

[2] Nano-sized surface modifications induced by the impact of slow highly charged ions - A first review [J].

Aumayr, F. ;

El-Said, A. S. ;

Meissl, W. .

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 2008, 266 (12-13) :2729-2735

[3]

Aumayr F., 2007, SPRINGER TRACKS MODE

[4]

Aumayr F., 2003, Surf. Sci. Nanotech, V1, P171

[5] Single ion induced surface nanostructures: a comparison between slow highly charged and swift heavy ions [J].

Aumayr, Friedrich ;

Facsko, Stefan ;

El-Said, Ayman S. ;

Trautmann, Christina ;

Schleberger, Marika .

JOURNAL OF PHYSICS-CONDENSED MATTER, 2011, 23 (39)

[6] ELECTRON-EMISSION FROM A METAL-SURFACE BOMBARDED BY SLOW HIGHLY CHARGED IONS [J].

DELAUNAY, M ;

FEHRINGER, M ;

GELLER, R ;

HITZ, D ;

VARGA, P ;

WINTER, H .

PHYSICAL REVIEW B, 1987, 35 (09) :4232-4235

[7] SEPARATION OF KINETIC AND POTENTIAL ELECTRON-EMISSION ARISING FROM SLOW MULTICHARGED ION-SURFACE INTERACTIONS [J].

HUGHES, IG ;

BURGDORFER, J ;

FOLKERTS, L ;

HAVENER, CC ;

OVERBURY, SH ;

ROBINSON, MT ;

ZEHNER, DM ;

VANEMMICHOVEN, PAZ ;

MEYER, FW .

PHYSICAL REVIEW LETTERS, 1993, 71 (02) :291-294

[8] Multicharged ion impact on clean Au(111): Suppression of kinetic electron emission in glancing angle scattering [J].

Lemell, C ;

Stockl, J ;

Burgdorfer, J ;

Betz, G ;

Winter, HP ;

Aumayr, F .

PHYSICAL REVIEW LETTERS, 1998, 81 (09) :1965-1968

[9] In-situ observation of surface modification induced by highly charged ion bombardment [J].

Minniti, R ;

Ratliff, LP ;

Gillaspy, JD .

PHYSICA SCRIPTA, 2001, T92 :22-26

[10] Scanning tunneling microscopy and atomic force microscopy study of graphite defects produced by bombarding with highly charged ions [J].

Mochiji, K ;

Yamamoto, S ;

Shimizu, H ;

Ohtani, S ;

Seguchi, T ;

Kobayashi, N .

JOURNAL OF APPLIED PHYSICS, 1997, 82 (12) :6037-6040

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