Monte Carlo modeling of surface excitation in reflection electron energy loss spectroscopy spectrum for rough surfaces

被引:29
作者
Da, B. [1 ]
Mao, S. F.
Zhang, G. H.
Wang, X. P.
Ding, Z. J.
机构
[1] Univ Sci & Technol China, Hefei Natl Lab Phys Sci Microscale, Hefei 230026, Anhui, Peoples R China
基金
中国国家自然科学基金;
关键词
REAL METAL-SURFACES; ELASTIC-SCATTERING; SILICON SURFACES; SELF-ENERGY; BACKSCATTERING; PLASMONS; FLAT;
D O I
10.1063/1.4739491
中图分类号
O59 [应用物理学];
学科分类号
摘要
It has been experimentally found that the surface roughness influences strongly the surface and bulk plasmon excitation by glancing-angle reflection electron energy loss spectroscopy (REELS). However, there is still little theoretical work dealing with the surface roughness effect in REELS. Such a work is required to predict REELS spectra accurately, providing an understanding of the experimental phenomena observed. In this study, we use a finite element triangle mesh method build in a fully 3D rough surface model based on the surface topography measured by atomic force microscopy. Then REELS spectra for these rough surfaces are theoretically simulated by using Monte Carlo simulation including surface plasmon excitation and bulk plasmon excitation. The simulation results for Al sample with different surface roughnesses agree well with experimental data. Based on the analysis of the maximum depth of backscattered electrons and the depth distribution of surface bulk excitation under different conditions of roughness, the influence of surface roughness to the surface excitation in REELS spectra can be well understood. (C) 2012 American Institute of Physics. [http://dx.doi.org/10.1063/1.4739491]
引用
收藏
页数:9
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