Electrothermal vaporization for sample introduction in atomic absorption, atomic emission and plasma mass spectrometry-a critical review with focus on solid sampling and slurry analysis

被引：140

作者：

Resano, M. ^{[2
]}

Vanhaecke, F. ^{[3
]}

de Loos-Vollebregt, M. T. C. ^{[1
]}

机构：

[1] Delft Univ Technol, Fac Sci Appl, NL-2628 BL Delft, Netherlands

[2] Univ Zaragoza, Dept Analyt Chem, E-50009 Zaragoza, Spain

[3] Univ Ghent, Dept Analyt Chem, B-9000 Ghent, Belgium

来源：

JOURNAL OF ANALYTICAL ATOMIC SPECTROMETRY | 2008年 / 23卷 / 11期

关键词：

D O I：

10.1039/b807756h

中图分类号：

O65 [分析化学];

学科分类号：

070302 ; 081704 ;

摘要：

The aim of this work is to review and compare the present possibilities of electrothermal atomic absorption spectrometry (ETAAS), electrothermal vaporization-inductively coupled plasma-optical emission spectrometry (ETV-ICP-OES) and electrothermal vaporization-inductively coupled plasma-mass spectrometry (ETV-ICP-MS) for analysis of solid samples, slurries and complex matrixes. The paper keeps in perspective the historical evolution of these techniques, providing an overview of the most relevant advances in instrumentation, methodology and fundamentals and highlighting the most relevant applications carried out during the last decade. The benefits of continuum source-AAS, the possible impact of diode lasers on this technique, the potential of ETV-ICP-methods for fractionation/speciation studies, as well as for resolving spectral interferences, and the influence of the different types of ICP-MS instrumentation currently available on the overall performance of ETV-ICP-MS will be some of the aspects discussed in more detail.

引用

页码：1450 / 1475

页数：26

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