Review: Cantilever-Based Sensors for High Speed Atomic Force Microscopy

被引:42
作者
Alunda, Bernard Ouma [1 ]
Lee, Yong Joong [2 ]
机构
[1] Taita Taveta Univ, Sch Mines & Engn, POB 635-80300, Voi, Kenya
[2] Kyungpook Natl Univ, Sch Mech Engn, Daegu 41566, South Korea
基金
新加坡国家研究基金会;
关键词
microcantilever; atomic force microscope; ultra-short cantilevers; high-speed atomic force microscope; biosensors; BEAM DEFLECTION TECHNIQUE; RESONANT MICROCANTILEVERS; ELECTRON-MICROSCOPY; AFM; MODE; TIP; SPECTROSCOPY; CELLS; RESOLUTION; DYNAMICS;
D O I
10.3390/s20174784
中图分类号
O65 [分析化学];
学科分类号
070302 ; 081704 ;
摘要
This review critically summarizes the recent advances of the microcantilever-based force sensors for atomic force microscope (AFM) applications. They are one the most common mechanical spring-mass systems and are extremely sensitive to changes in the resonant frequency, thus finding numerous applications especially for molecular sensing. Specifically, we comment on the latest progress in research on the deflection detection systems, fabrication, coating and functionalization of the microcantilevers and their application as bio- and chemical sensors. A trend on the recent breakthroughs on the study of biological samples using high-speed atomic force microscope is also reported in this review.
引用
收藏
页码:1 / 39
页数:39
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