Thermally Prepared Mn2O3/RuO2/Ru Thin Films as Highly Active Catalysts for the Oxygen Evolution Reaction in Alkaline Media

被引：24
作者：
Browne, Michelle P. [1 ,2 ,3 ]
Nolan, Hugo [1 ,2 ,3 ]
Twamley, Brendan [1 ]
Duesberg, Georg S. [1 ,2 ,3 ]
Colavita, Paula E. [1 ,2 ,3 ]
Lyons, Michael E. G. [1 ,2 ,3 ]
机构：
[1] Trinity Coll Dublin, Dept Chem, Dublin 2, Ireland
[2] Trinity Coll Dublin, CRANN, Dublin 2, Ireland
[3] Trinity Coll Dublin, Adv Mat & BioEngn Res AMBER Ctr, Dublin 2, Ireland
来源：
CHEMELECTROCHEM | 2016年 / 3卷 / 11期
基金：
爱尔兰科学基金会;
关键词：
manganese/ruthenium; oxygen evolution reaction; thin films; X-ray diffraction; X-ray photoelectron spectroscopy; ELECTROCHEMICAL WATER OXIDATION; MANGANESE OXIDE; OXIDIZED METAL; ELECTROCATALYSTS; ENHANCEMENT; KINETICS; PERFORMANCE; REDUCTION; HYDROXIDE; MECHANISM;
D O I：
10.1002/celc.201600370
中图分类号：
O646 [电化学、电解、磁化学];
学科分类号：
081704 ;
摘要：
Herein, a thermal decomposition method was utilised to fabricate pure and mixed manganese and ruthenium oxides as catalysts for the oxygen evolution reaction (OER). X-ray photoelectron spectroscopy (XPS) and X-ray diffraction (XRD) reveal the manganese and ruthenium species produced at an annealing temperature of 600 degrees C to be Mn2O3 and RuO2/Ru, respectively. A number of the mixed Mn/Ru oxides exhibit overpotential values approximately 200 mV lower than previously reported for Mn2O3/RuO2 oxides (at a current density of 10 mAcm(-2)) for the OER, whereas the Mn 50 material exhibits similar overpotentials reported in the literature for RuO2. Turnover frequency (TOF) numbers for the Mn/Ru oxides were also calculated, and the results show that the TOF values for some of the materials in this work are higher than RuO2. XPS analysis indicates a change in chemical environment of the Mn/Ru materials, which exhibit higher TOF values. Subsequently, the pure Ru 100 material used in this study has a lower overpotential at 10 mAcm(-2), as compared to previously reported values in the literature for RuO2 in alkaline media. This may be attributed to the presence of metallic Ru found in the film or the decrease in crystallite size, as determined by XRD. XPS analysis was also carried out after the OER to help determine the order of activity of the materials in this work.
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页码：1847 / 1855
页数：9
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