Signatures of an extended rigidity percolation in the photo-degradation behavior and the composition dependence of photo-response of Ge-Te-In glasses

被引：8

作者：

Manikandan, N. ^{[1
]}

Asokan, S. ^{[1
]}

机构：

[1] Indian Inst Sci, Dept Instrumentat, Bangalore 560012, Karnataka, India

来源：

JOURNAL OF NON-CRYSTALLINE SOLIDS | 2008年 / 354卷 / 31期

关键词：

chalcogenides; photoinduced effects; photo-conductivity;

D O I：

10.1016/j.jnoncrysol.2008.04.004

中图分类号：

TQ174 [陶瓷工业]; TB3 [工程材料学];

学科分类号：

0805 ; 080502 ;

摘要：

Time dependent photocurrent measurements have been undertaken on bulk Ge15Te85-xInx (1 <= x <= 11) series of glasses. It is found that samples with x < 3 do not exhibit any photo-degradation whereas a decrease in photo-conductivity under illumination is observed in samples with x >= 3. Further, the photosensitivity of Ge15Te85-xInx glasses is found to reveal specific signatures at compositions x = 3 and 7. The observed composition dependent photo-degradation behavior and photo-response of these glasses have been understood on the basis of an extended rigidity percolation and its influence on network related properties. (C) 2008 Elsevier B.V. All rights reserved.

引用

页码：3732 / 3734

页数：3

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