Comparison of Broadband Impedance Spectroscopy and Time Domain Reflectometry for Locating Cable Degradation

被引：0

作者：

Hirai, Naoshi ^{[1
]}

Yamada, Takayuki ^{[2
]}

Ohki, Yoshimichi ^{[2
]}

机构：

[1] Waseda Univ, Res Inst Sci & Engn, Tokyo, Japan

[2] Waseda Univ, Dept Elect Engn & Bioscience, Tokyo, Japan

来源：

PROCEEDINGS OF 2012 IEEE INTERNATIONAL CONFERENCE ON CONDITION MONITORING AND DIAGNOSIS (IEEE CMD 2012) | 2012年

关键词：

Broadband impedance spectroscopy; frequency domain reflectometry; time domain reflectometry; insulation; diagnosis; nuclear power plant;

D O I：

暂无

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

A new method called the broadband impedance spectroscopy (BIS), which is a kind of frequency domain reflectometry, is being developed as a reliable method for locating a degraded portion of a low voltage cable. The sensitivity of the BIS method is compared to that of the time domain reflectometry (TDR). In the first case, the sheath and insulation of a 50-m-long polyvinyl chloride insulated cable were partially peeled off. In the second case, cables insulated with silicone rubber, flame-retardant ethylene propylene rubber, or crosslinked polyethylene, each about 25 m long, were aged simultaneously by heat and gamma-irradiation in air. In both two cases, a clear peak indicating the damaged or aged portion appears in the BIS measurement, while no such a peak appears in the TDR measurement. Therefore, the BIS method is much superior to the TDR method for locating a degraded portion in a cable.

引用

页码：229 / 232

页数：4