DC built-in self-test for linear analog circuits

被引：16

作者：

Chatterjee, A

Kim, BC

Nagi, N

机构：

[1] Indian Institute of Technology, Kanpur

[2] University of Illinois, Chicago, IL

[3] University of Illinois, Urbana-Champaign, IL

[4] University of California, Irvine, CA

[5] IEEE Computer Society, ACM

[6] LogicVision, San Jose, CA

[7] University of Texas, Austin, TX

[8] Sch. of Elec. and Comp. Engineering, Georgia Institute of Technology, Atlanta

来源：

IEEE DESIGN & TEST OF COMPUTERS | 1996年 / 13卷 / 02期

关键词：

D O I：

10.1109/54.500198

中图分类号：

TP3 [计算技术、计算机技术];

学科分类号：

0812 ;

摘要：

DC testing of analog circuits is cheaper than AC testing and covers many fault classes, including some that AC tests cannot detect. This efficient, low-cost, built-in self-test (BIST) methodology uses the checksum encodings of matrix representations to uncover faults that affect a circuit's DC transfer function.

引用

页码：26 / 33

页数：8

共 11 条

[1]

[Anonymous], P INT C COMP AID DES

[2]

BENHAMIDA N, 1993, INTERNATIONAL TEST CONFERENCE 1993 PROCEEDINGS, P652, DOI 10.1109/TEST.1993.470638

[3] Concurrent error detection and fault-tolerance linear analog circuits using continuous checksums [J].