Infrared optical properties of SrBi2Ta2O9 ferroelectric thin films

被引：22

作者：

Huang, ZM ^{[1
]}

Yang, PX ^{[1
]}

Chang, Y ^{[1
]}

Chu, JH ^{[1
]}

机构：

[1] Chinese Acad Sci, Shanghai Inst Tech Phys, Natl Lab Infrared Phys, Shanghai 200083, Peoples R China

来源：

JOURNAL OF APPLIED PHYSICS | 1999年 / 86卷 / 03期

关键词：

D O I：

10.1063/1.370963

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

Infrared optical constants of strontium bismuth tantalate (SBT) ferroelectric thin films have been derived from infrared spectroscopic ellipsometric measurements (2.5-12.5 mm). By fitting the experimental pseudodielectric constants [epsilon(1)] and [epsilon(2)] with a three-phase model (Air/SBT/Pt), the optical constants and thickness of the films have been obtained, and an intrinsic vibrational frequency of the films at 802 cm(-1) has also been acquired. The possible contribution to the vibrational frequency has been discussed. (C) 1999 American Institute of Physics. [S0021-8979(99)08415-7].

引用

页码：1771 / 1773

页数：3

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