High-resolution seismic reflection coefficient calculation using a Chirp Sub-bottom Profiler

被引：0

作者：

Sanhaji, Mohammed ^{[1
]}

Porto, Sabrina ^{[1
]}

Guarin, Humberto ^{[2
]}

机构：

[1] EdgeTech, Boca Raton, FL 33487 USA

[2] Bert Instruments Inc, Miami, FL USA

来源：

2013 IEEE/OES ACOUSTICS IN UNDERWATER GEOSCIENCES SYMPOSIUM (RIO ACOUSTICS 2013) | 2013年

关键词：

EdgeTech; Bert Instruments Inc; Sub-bottom Profiler; high-resolution seismic reflection system; reflection coefficient;

D O I：

暂无

中图分类号：

O42 [声学];

学科分类号：

070206 ; 082403 ;

摘要：

High-resolution seismic data were collected by the Bert Instruments Inc. Company at the South-American Continental Shelf using EdgeTech SB-0512i sub-bottom profiler with frequency band from 500 Hz to 12 kHz. Core samples were taken along with 3 seismic sections in reason to allow detailed analysis of the layers which reflection coefficients were measured. The results were compared to Dr. Edwin L. Hamilton studies.

引用

页数：3

共 7 条

[1] [Anonymous], THESIS
[2] Beaujean P.P. J., 1995, THESIS, P69
[3] Falcao L C., 2010, Revista Brasileira de Geofisica, V28, P279, DOI [10.1590/S0102-261X2010000200011, DOI 10.1590/S0102-261X2010000200011]
[4] PREDICTION OF IN-SITU ACOUSTIC AND ELASTIC PROPERTIES OF MARINE SEDIMENTS
HAMILTON, EL
[J]. GEOPHYSICS, 1971, 36 (02) : 266 - &
[5] REFLECTION COEFFICIENTS AND BOTTOM LOSSES AT NORMAL INCIDENCE COMPUTED FROM PACIFIC SEDIMENT PROPERTIES
HAMILTON, EL
[J]. GEOPHYSICS, 1970, 35 (06) : 995 - &
[6] Macedo HC., 2009, Rev Brasil Geofis, V27, P195
[7] High-Resolution Geoacoustic Characterization of the Seafloor Using a Subbottom Profiler in the Gulf of Lion
Theuillon, Gwladys
Stephan, Yann
Pacault, Anne
[J]. IEEE JOURNAL OF OCEANIC ENGINEERING, 2008, 33 (03) : 240 - 254

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