Electrochemical migration investigations on Sn-Sb solder alloys using 3.5 wt% NaCl solution

被引:0
|
作者
Medgyes, Balint [1 ]
Kiss, Robert [1 ]
Szurdan, Szabolcs [2 ]
Rigler, Daniel [1 ]
Gal, Laszlo [1 ]
Berenyi, Richard [1 ]
Harsanyi, Gabor [1 ]
机构
[1] Budapest Univ Technol & Econ, Dept Elect Technol, Budapest, Hungary
[2] Univ Miskolc, Fac Mat Sci & Engn, Miskolc, Hungary
来源
2017 40TH INTERNATIONAL SPRING SEMINAR ON ELECTRONICS TECHNOLOGY (ISSE) | 2017年
关键词
SN-3.0AG-0.5CU SOLDER; WHISKER GROWTH; IN-SITU; TIN; CHLORIDE;
D O I
暂无
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
ECM (electrochemical migration) is sort of short failure mechanism that can lead to series defect in case of loaded circuits, when moisture exist on/in a conductor-dielectric-conductor system. Water drop (WD) test and scanning electron microscopy - energy disperse spectroscopy (SEM-EDS) methods were used to investigate the ECM behavior on different Sn-Sb alloys and pure Sn was the reference. The results show that all of the samples have similar ECM risk comparing to the pure Sn. However, in case of Sn95-Sb5 solder alloy antimony was found in the dendrites next to Sn content, which was dominated during the ECM processes in all cases.
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页数:4
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