Band offset and electronic properties at semipolar plane AlN(1(1)over-bar01)/diamond heterointerface

被引:5
作者
Wu, Kong-Ping [1 ]
Ma, Wen-Fei [1 ]
Sun, Chang-Xu [1 ]
Chen, Chang-Zhao [1 ]
Ling, Liu-Yi [1 ]
Wang, Zhong-Gen [1 ]
机构
[1] Anhui Univ Sci & Technol, Sch Elect & Informat Engn, Huainan 232001, Peoples R China
关键词
diamond; heterointerface; charge transfer; band offset; DIAMOND; 100; SURFACE; AFFINITY; ALN; HETEROJUNCTIONS; 1ST-PRINCIPLES; SEMICONDUCTOR; VACANCY; ALLOYS; STATES;
D O I
10.1088/1674-1056/27/5/058101
中图分类号
O4 [物理学];
学科分类号
0702 ;
摘要
Tailoring the electronic states of the AlN/diamond interface is critical to the development of the next-generation semiconductor devices such as the deep-ultraviolet light-emitting diode, photodetector, and high-power high-frequency field-effect transistor. In this work, we investigate the electronic properties of the semipolar plane AlN(1(1)over-bar01)/diamond heterointerfaces by using the first-principles method with regard to different terminated planes of AlN and surface structures of diamond (100) plane. A large number of gap states exist at semi-polar plane AlN(1(1)over-bar01)/diamond heterointerface, which results from the N 2p and C 2s2p orbital states. Besides, the charge transfer at the interface strongly depends on the surface termination of diamond, on which hydrogen suppresses the charge exchange at the interface. The band alignments of semi-polar plane AlN(1(1)over-bar01)/diamond show a typical electronic character of the type-II staggered band configuration. The hydrogen-termination of diamond markedly increases the band offset with a maximum valence band offset of 2.0 eV and a conduction band offset of 1.3 eV for the semi-polar plane N-AlN(1(1)over-bar01)/hydrogenated diamond surface. The unique band alignment of this Type-II staggered system with the higher CBO and VBO of the semi-polar AlN/HC(100) heterostructure provides an avenue to the development of robust high-power high-frequency power devices.
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页数:8
相关论文
共 48 条
[1]   Valence-band offset of the lattice-matched β-FeSi2(100)/Si(001) heterostructure -: art. no. 033311 [J].
Al-Allak, HM ;
Clark, SJ .
PHYSICAL REVIEW B, 2001, 63 (03)
[2]  
[Anonymous], J PHYS CONDENS MATTE
[3]   An AlN/Al0.85Ga0.15N high electron mobility transistor [J].
Baca, Albert G. ;
Armstrong, Andrew M. ;
Allerman, Andrew A. ;
Douglas, Erica A. ;
Sanchez, Carlos A. ;
King, Michael P. ;
Coltrin, Michael E. ;
Fortune, Torben R. ;
Kaplar, Robert J. .
APPLIED PHYSICS LETTERS, 2016, 109 (03)
[4]   Exchange functional that tests the robustness of the plasmon description of the van der Waals density functional [J].
Berland, Kristian ;
Hyldgaard, Per .
PHYSICAL REVIEW B, 2014, 89 (03)
[5]   First-principles study on electronic properties and lattice structures of WZ-ZnO/CdS interface [J].
Cheng, Yu-Wen ;
Tang, Fu-Ling ;
Xue, Hong Tao ;
Liu, Hong-Xia ;
Gao, Bo ;
Feng, Yu-Dong .
MATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING, 2016, 45 :9-16
[6]   Enhanced surface transfer doping of diamond by V2O5 with improved thermal stability [J].
Crawford, Kevin G. ;
Cao, Liang ;
Qi, Dongchen ;
Tallaire, Alexandre ;
Limiti, E. ;
Verona, C. ;
Wee, Andrew T. S. ;
Moran, David A. J. .
APPLIED PHYSICS LETTERS, 2016, 108 (04)
[7]   High-reliability passivation of hydrogen-terminated diamond surface by atomic layer deposition of Al2O3 [J].
Daicho, Akira ;
Saito, Tatsuya ;
Kurihara, Shinichiro ;
Hiraiwa, Atsushi ;
Kawarada, Hiroshi .
JOURNAL OF APPLIED PHYSICS, 2014, 115 (22)
[8]   Chemical trends of stability and band alignment of lattice-matched II-VI/III-V semiconductor interfaces [J].
Deng, Hui-Xiong ;
Luo, Jun-Wei ;
Wei, Su-Huai .
PHYSICAL REVIEW B, 2015, 91 (07)
[9]   Quantum Confinement Effects and Electronic Properties of SnO2 Quantum Wires and Dots [J].
Deng, Hui-Xiong ;
Li, Shu-Shen ;
Li, Jingbo .
JOURNAL OF PHYSICAL CHEMISTRY C, 2010, 114 (11) :4841-4845
[10]   β-Si3N4(0001)/Si(111) interface: Phosphorus defects, valence band offsets, and their role of passivating the interface states [J].
Flage-Larsen, E. ;
Lovvik, O. M. ;
Fang, C. M. ;
Kresse, G. .
PHYSICAL REVIEW B, 2013, 88 (16)