Analysis of silver columnar thin films by atomic force microscopy

被引：1
|
作者：
Benkabou, Fatima [1 ]
Lakhtakia, Akhlesh [2 ]
机构：
[1] Univ Moncton, Dept Phys & Astron, Moncton, NB E1A 3E9, Canada
[2] Penn State Univ, NanoMM Nanoengn Metamat Grp, Dept Engn Sci & Mech, University Pk, PA 16802 USA
来源：
NANOSTRUCTURED THIN FILMS | 2008年 / 7041卷
关键词：
Atomic force microscope; columnar thin film; sculptured thin film; silver; surface morphology;
D O I：
10.1117/12.796212
中图分类号：
TB3 [工程材料学];
学科分类号：
0805 ; 080502 ;
摘要：
Analyses of the top-surface morphology of columnar thin films (CTFs) of silver, grown by a combination of the usual oblique-angle-deposition technique with very fast substrate rotation, confirm that silver CTFs consist of more isolated and quasiperiodically distributed nanowires for higher vapor incidence angle during deposition. The top surfaces then are well-suited for the exploitation of surface-enhanced Raman scattering and localized surface-plasmon resonance.
引用
收藏
页数：7
相关论文
共 50 条
  • [1] Theoretical analysis of the atomic force microscopy characterization of columnar thin films
    Klapetek, P
    Ohlídal, I
    ULTRAMICROSCOPY, 2003, 94 (01) : 19 - 29
  • [2] Atomic force microscopy studies of cross-sections of columnar thin films
    Klapetek, P.
    Ohlidal, I.
    Bursik, J.
    MEASUREMENT SCIENCE AND TECHNOLOGY, 2007, 18 (02) : 528 - 531
  • [3] Growth analysis of cadmium sulfide thin films by atomic force microscopy
    Moutinho, HR
    Dhere, RG
    Ramanathan, K
    Sheldon, P
    Kazmerski, LL
    CONFERENCE RECORD OF THE TWENTY FIFTH IEEE PHOTOVOLTAIC SPECIALISTS CONFERENCE - 1996, 1996, : 945 - 948
  • [4] Atomic force microscopy and XRD analysis of silver films deposited by thermal evaporation
    Maqbool, M
    Khan, T
    INTERNATIONAL JOURNAL OF MODERN PHYSICS B, 2006, 20 (02): : 217 - 231
  • [5] Thin liquid films studied by atomic force microscopy
    Bonaccurso, Elmar
    Kappl, Michael
    Butt, Hans-Juergen
    CURRENT OPINION IN COLLOID & INTERFACE SCIENCE, 2008, 13 (03) : 107 - 119
  • [6] Atomic and Kelvin probe force microscopy of thin films
    Alessandrini, A
    Valdrè, U
    PROCEEDINGS OF THE 5TH MULTINATIONAL CONGRESS ON ELECTRON MICROSCOPY, 2001, : 553 - 554
  • [7] Sectional examination of thin films by atomic force microscopy
    Echeverria, F
    Skeldon, P
    Thompson, GE
    Walton, JR
    Habazaki, H
    Shimizu, K
    ELECTROCHEMICAL AND SOLID STATE LETTERS, 1998, 1 (01) : 24 - 26
  • [8] Sectional examination of thin films by atomic force microscopy
    Univ of Manchester Inst of Science, and Technology, Manchester, United Kingdom
    Electrochem Solid State Letters, 1 (24-26):
  • [9] Characterization of polyamide thin films by atomic force microscopy
    McIntee, Olivia M.
    Sreedhar, Nurshaun
    Welch, Brian C.
    Bright, Victor M.
    Roy, Abhishek
    Paul, Mou
    Greenberg, Alan R.
    POLYMER, 2024, 308
  • [10] Structure and modification of silver halide thin films using scanning tunneling and atomic force microscopy
    Swanson, A
    Blakely, J
    SURFACE SCIENCE, 1997, 394 (1-3) : 221 - 234
12345