Analysis of Minority Carrier Lifetime Dependence on Dual Gate Feedback Field Effect Transistor

In this paper, we investigated the dependence of minority carrier lifetime on dual gate FBFET. Generally, depending on the channel condition or trap density, the lifetime of minority carrier can be degraded. Since the potential barrier lowering through the accumulated carriers is essential for positive feedback, the deterioration of lifetime can make a critical influence on the operation of device. Therefore, we verified the tendency of threshold voltage according to carrier lifetime and channel length. Through the comparison with p-n diode and FBFET, we drew the relation between lifetime and threshold voltage. As a result, it has been confirmed that the device with significantly deteriorated lifetime or the device with extremely long channel does not effectively generate feedback and loses its steep switching characteristics.