Experimental and numerical analysis of coupled interfacial kinetics and heat transport during the axial heat flux close to the phase interface growth of BGO single crystals

被引:4
作者
Bykova, SV
Golyshev, VD
Gonik, MA [1 ]
Tsvetovsky, VB
Deshko, VI
Karvatskii, AY
Lenkin, AV
Brandon, S
Weinstein, O
Virozub, A
Derby, JJ
Yeckel, A
Sonda, P
机构
[1] Ctr Thermophys Res Thermo, Aleksandrov, Russia
[2] Kiev Polytech Inst, UA-252056 Kiev, Ukraine
[3] Technion Israel Inst Technol, Dept Chem Engn, IL-32000 Haifa, Israel
[4] Univ Minnesota, Dept Chem Engn & Mat Sci, Minneapolis, MN 55455 USA
关键词
interfaces; growth from melt; bismuth germanate;
D O I
10.1016/j.jcrysgro.2004.02.052
中图分类号
O7 [晶体学];
学科分类号
0702 ; 070205 ; 0703 ; 080501 ;
摘要
Combined experimental and numerical tools are used to analyze the effect of convective and radiative heat transport, faceting phenomena, and the optical thickness of the Bi4Ge3O12 (BGO) crystal on the measurement and calculation of melt/crystal interface kinetics during the axial heat flux close to the phase interface growth of BGO single crystals. Results show that, in the general case, accurate determination of growth kinetic relations requires the application of models which account for all of the above phenomena (radiative and convective heat transport, faceting phenomena, etc.). Failure to take these into account may result not only in quantitative errors, but also even in qualitatively wrong determination of interfacial kinetic mechanisms. (C) 2004 Elsevier B.V. All rights reserved.
引用
收藏
页码:246 / 256
页数:11
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