Towards three-dimensional structural determination of amorphous materials at atomic resolution

被引：19

作者：

Zhu, Chun ^{[1
,2
]}

Chen, Chien-Chun ^{[1
,2
]}

Du, Jincheng ^{[3
]}

Sawaya, Michael R. ^{[4
]}

Scott, M. C. ^{[1
,2
]}

Ercius, Peter ^{[5
]}

Ciston, James ^{[5
]}

Miao, Jianwei ^{[1
,2
]}

机构：

[1] Univ Calif Los Angeles, Dept Phys & Astron, Los Angeles, CA 90095 USA

[2] Univ Calif Los Angeles, Calif NanoSyst Inst, Los Angeles, CA 90095 USA

[3] Univ N Texas, Dept Mat Sci & Engn, Denton, TX 76203 USA

[4] Univ Calif Los Angeles, Howard Hughes Med Inst, DOE, Inst Genom & Prote, Los Angeles, CA 90095 USA

[5] Univ Calif Berkeley, Lawrence Berkeley Natl Lab, Natl Ctr Electron Microscopy, Berkeley, CA 94720 USA

来源：

PHYSICAL REVIEW B | 2013年 / 88卷 / 10期

基金：

美国国家科学基金会;

关键词：

MOLECULAR-DYNAMICS SIMULATION; ELECTRON-MICROSCOPY; PHASE-CONTRAST; SILICA GLASS; RAY; TOMOGRAPHY;

D O I：

10.1103/PhysRevB.88.100201

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

Through numerical experiments, we demonstrate an electron tomography method for three-dimensional (3D) structural determination of amorphous materials at atomic resolution. By combining multislice simulations of an aberration-corrected scanning transmission electron microscope with equally sloped tomography, we have determined the 3D atomic structure of a simulated glass particle, consisting of 334 Si and 668 O atoms, from a tilt series of 55 noisy projections. An atomic model refinement method has been implemented to locate the positions of the Si and O atoms in the reconstruction. We expect that the development of this general method will find applications across several disciplines in the physical sciences.

引用

页数：5

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