Prognostic Degradation Models for Computing and Updating Residual Life Distributions in a Time-Varying Environment

被引:169
作者
Gebraeel, Nagi [1 ]
Pan, Jing [2 ]
机构
[1] Georgia Inst Technol, Sch Ind & Syst Engn, Atlanta, GA 30313 USA
[2] Univ Iowa, Dept Stat & Actuarial Sci, Iowa City, IA 52242 USA
基金
美国国家科学基金会;
关键词
Condition monitoring; degradation modeling; prognostics;
D O I
10.1109/TR.2008.928245
中图分类号
TP3 [计算技术、计算机技术];
学科分类号
0812 ;
摘要
This paper presents a degradation modeling framework for computing condition-based residual life distributions of partially degraded systems and/or components functioning under time-varying environmental and/or operational conditions. Our approach is to mathematically model degradation-based signals from a population of components using stochastic models that combine three main sources of information: real-time degradation characteristics of component obtained by observing the component's in-situ degradation signal, the degradation characteristics of the component's population, and the real-time status of the environmental conditions under which the component is operating. Prior degradation information is used to estimate the model coefficients. The resulting generalized stochastic degradation model is then used to predict an initial residual life distribution for the component being monitored. In-situ degradation signals, along with real-time information related to the environmental conditions, are then used to update the residual life distributions in real-time. Because these updated distributions capture current health information and the latest environmental conditions, they provide precise lifetime estimates. The performance of the proposed models is evaluated using real world vibration-based degradation signals from a rotating machinery application.
引用
收藏
页码:539 / 550
页数:12
相关论文
共 40 条
[11]   Residual-life distributions from component degradation signals: A Bayesian approach [J].
Gebraeel, NZ ;
Lawley, MA ;
Li, R ;
Ryan, JK .
IIE TRANSACTIONS, 2005, 37 (06) :543-557
[12]  
Harris T., 2001, ROLLING BEARING ANAL, V4th
[13]   Accelerated discrete degradation models for leakage current of ultra-thin gate oxides [J].
Hsieh, Min-Hsiung ;
Jeng, Shuen-Lin .
IEEE TRANSACTIONS ON RELIABILITY, 2007, 56 (03) :369-380
[14]   Reliability improvement experiments with degradation data [J].
Joseph, VR ;
Yu, IT .
IEEE TRANSACTIONS ON RELIABILITY, 2006, 55 (01) :149-157
[15]   Availability of periodically inspected systems with markovian wear and shocks [J].
Kharoufeh, Jeffrey P. ;
Finkelstein, Daniel E. ;
Mixon, Dustin G. .
JOURNAL OF APPLIED PROBABILITY, 2006, 43 (02) :303-317
[16]   Stochastic models for degradation-based reliability [J].
Kharoufeh, JP ;
Cox, SM .
IIE TRANSACTIONS, 2005, 37 (06) :533-542
[17]   The availability of inspected systems subject to shocks and graceful degradation [J].
Klutke, GA ;
Yang, YJ .
IEEE TRANSACTIONS ON RELIABILITY, 2002, 51 (03) :371-374
[18]   Covariates and random effects in a gamma process model with application to degradation and failure [J].
Lawless, J ;
Crowder, M .
LIFETIME DATA ANALYSIS, 2004, 10 (03) :213-227
[19]   Threshold regression for survival analysis: Modeling event times by a stochastic process reaching a boundary [J].
Lee, Mei-Ling Ting ;
Whitmore, G. A. .
STATISTICAL SCIENCE, 2006, 21 (04) :501-513
[20]  
LI Y, 1999, LUBR ENG, V42, P385