Smoothing of reaction sintered silicon carbide using plasma assisted polishing

被引:22
作者
Deng, Hui [1 ]
Yamamura, Kazuya [1 ]
机构
[1] Osaka Univ, Grad Sch Engn, Res Ctr Ultra Precis Sci & Technol, Suita, Osaka 5650871, Japan
基金
日本科学技术振兴机构;
关键词
Atmospheric pressure water vapor plasma; Abrasive polishing; Reaction sintered silicon carbide; Modification; Hardness; MATERIAL REMOVAL; SURFACES;
D O I
10.1016/j.cap.2012.04.004
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
We proposed a novel polishing technique named plasma assisted polishing (PAP) for the finishing of some difficult-to-machine materials, such as diamond, silicon carbide, sapphire and so on. In this work, PAP was applied to the smoothing of reaction sintered silicon carbide (RS-SiC) surface. Experimental results indicated that a higher oxidation rate led to a smoother surface. The smoothing mechanism was discussed based on the relationship between oxidation rate of RS-SiC and polishing rate of oxide layer. Through increase in the oxidation rate and decrease in the polishing rate, a smooth surface with 11.42 nm p-v and 0.91 nm rms was obtained. The amount and depth of scratches also decreased after PAP using ceria abrasives compared with the surface polished by diamond abrasives. (c) 2012 Elsevier B.V. All rights reserved.
引用
收藏
页码:S24 / S28
页数:5
相关论文
共 12 条
[1]   Material removal and micro-roughness in fluid-assisted smoothing of reaction-bonded silicon carbide surfaces [J].
Cheng, H. B. ;
Feng, Y. P. ;
Ren, L. Q. ;
To, Suet ;
Wang, Y. T. .
JOURNAL OF MATERIALS PROCESSING TECHNOLOGY, 2009, 209 (09) :4563-4567
[2]   Damage-Free Dry Polishing of 4H-SiC Combined with Atmospheric-Pressure Water Vapor Plasma Oxidation [J].
Deng, Hui ;
Takiguchi, Tatsuya ;
Ueda, Masaki ;
Hattori, Azusa N. ;
Zettsu, Nobuyuki ;
Yamamura, Kazuya .
JAPANESE JOURNAL OF APPLIED PHYSICS, 2011, 50 (08)
[3]   Role of microstructure on surface and subsurface damage of sintered silicon carbide during grinding and polishing [J].
Gao, Jianqin ;
Chen, Jian ;
Liu, Guiling ;
Yan, Yongpe ;
Liu, Xuejian ;
Huang, Zhengren .
WEAR, 2010, 270 (1-2) :88-94
[4]   ARXPS STUDIES OF SIO2-SIC INTERFACES AND OXIDATION OF 6H SIC SINGLE-CRYSTAL SI-(001) AND C-(001)OVER-BAR SURFACES [J].
HORNETZ, B ;
MICHEL, HJ ;
HALBRITTER, J .
JOURNAL OF MATERIALS RESEARCH, 1994, 9 (12) :3088-3094
[5]   AN IMPROVED TECHNIQUE FOR DETERMINING HARDNESS AND ELASTIC-MODULUS USING LOAD AND DISPLACEMENT SENSING INDENTATION EXPERIMENTS [J].
OLIVER, WC ;
PHARR, GM .
JOURNAL OF MATERIALS RESEARCH, 1992, 7 (06) :1564-1583
[6]  
Shu Y., 2010, American Journal of Nanotechnology, V1, P45, DOI [10.3844/ajnsp.2010.45.50, DOI 10.3844/AJNSP.2010.45.50]
[7]   Development of high-strength reaction-sintered silicon carbide [J].
Suyama, S ;
Kameda, T ;
Itoh, Y .
DIAMOND AND RELATED MATERIALS, 2003, 12 (3-7) :1201-1204
[8]   NTSIC (New-Technology Silicon Carbide): Evaluation of microstructure of high-strength reaction-sintered silicon carbide for optical mirror - art. no. 66660K [J].
Suyama, Shoko ;
Itoh, Yoshiyasu .
OPTICAL MATERIALS AND STRUCTURES TECHNOLOGIES III, 2007, 6666 :K6660-K6660
[9]   Plasma assisted polishing of single crystal SiC for obtaining atomically flat strain-free surface [J].
Yamamura, K. ;
Takiguchi, T. ;
Ueda, M. ;
Deng, H. ;
Hattori, A. N. ;
Zettsu, N. .
CIRP ANNALS-MANUFACTURING TECHNOLOGY, 2011, 60 (01) :571-574
[10]   High-integrity finishing of 4H-SiC (0001) by plasma-assisted polishing [J].
Yamamura, Kazuya ;
Takiguchi, Tatsuya ;
Ueda, Masaki ;
Hattori, Azusa N. ;
Zettsu, Nobuyuki .
ADVANCES IN ABRASIVE TECHNOLOGY XIII, 2010, 126-128 :423-428