Pseudomorphic thick InGaN growth with a grading interlayer by metal organic chemical vapor deposition for InGaN/GaN p-i-n solar cells

被引:12
作者
Bae, Si-Young [1 ]
Song, Young-Ho [2 ]
Jeon, Seong-Ran [2 ]
Kim, Dong-Min [1 ]
Jho, Young-Dahl [1 ]
Lee, Dong-Seon [1 ]
机构
[1] Gwangju Inst Sci & Technol, Sch Informat & Commun, Kwangju 500712, South Korea
[2] Korea Photon Technol Inst, Kwangju 500779, South Korea
基金
新加坡国家研究基金会;
关键词
Crystal morphology; Metalorganic chemical vapor deposition; Nitrides; Solar cells; GAN; STRAIN; RELAXATION;
D O I
10.1016/j.jcrysgro.2013.10.031
中图分类号
O7 [晶体学];
学科分类号
0702 ; 070205 ; 0703 ; 080501 ;
摘要
Thick InGaN alloys with high In content are essential for emerging InGaN photovoltaic applications. By applying a compositionally graded structure, various thicknesses of InGaN layers were grown using metal organic chemical vapor deposition. We could obtain pseudomorphic and highly strained layer even upto 100 nm of InGaN film as confirmed by X-ray reciprocal space mapping and Raman spectra. To probe the validity of those InGaN layers for solar cell applications, optical transmittance measurements were carried out and absorption properties were compared. (C) 2013 Elsevier B.V. All rights reserved.
引用
收藏
页码:23 / 28
页数:6
相关论文
共 29 条
[1]  
[Anonymous], 2007, INTRO OPTICS
[2]   Monte Carlo calculation of velocity-field characteristics of wurtzite GaN [J].
Bhapkar, UV ;
Shur, MS .
JOURNAL OF APPLIED PHYSICS, 1997, 82 (04) :1649-1655
[3]   Numerical investigation on the enhanced carrier collection efficiency of Ga-face GaN/InGaN p-i-n solar cells with polarization compensation interlayers [J].
Chang, Jih-Yuan ;
Liou, Bo-Ting ;
Lin, Han-Wei ;
Shih, Ya-Hsuan ;
Chang, Shu-Hsuan ;
Kuo, Yen-Kuang .
OPTICS LETTERS, 2011, 36 (17) :3500-3502
[4]   Raman study of the A1(LO) phonon in relaxed and pseudomorphic InGaN epilayers [J].
Correia, MR ;
Pereira, S ;
Pereira, E ;
Frandon, J ;
Alves, E .
APPLIED PHYSICS LETTERS, 2003, 83 (23) :4761-4763
[5]   InGaN/GaN multiple quantum well concentrator solar cells [J].
Dahal, R. ;
Li, J. ;
Aryal, K. ;
Lin, J. Y. ;
Jiang, H. X. .
APPLIED PHYSICS LETTERS, 2010, 97 (07)
[6]   VEGARD LAW [J].
DENTON, AR ;
ASHCROFT, NW .
PHYSICAL REVIEW A, 1991, 43 (06) :3161-3164
[7]   RELAXATION PROCESS OF THE THERMAL STRAIN IN THE GAN/ALPHA-AL2O3 HETEROSTRUCTURE AND DETERMINATION OF THE INTRINSIC LATTICE-CONSTANTS OF GAN FREE FROM THE STRAIN [J].
DETCHPROHM, T ;
HIRAMATSU, K ;
ITOH, K ;
AKASAKI, I .
JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS & EXPRESS LETTERS, 1992, 31 (10B) :L1454-L1456
[8]   Structural Characterization of Highly Conducting AlGaN (x > 50%) for Deep-Ultraviolet Light-Emitting Diode [J].
Dion, Joseph ;
Fareed, Qhalid ;
Zhang, Bin ;
Khan, Asif .
JOURNAL OF ELECTRONIC MATERIALS, 2011, 40 (04) :377-381
[9]  
Görgens L, 2000, APPL PHYS LETT, V76, P577, DOI 10.1063/1.125822
[10]   Reduction of threading dislocation density in GaN grown on strain relaxed nanoporous GaN template [J].
Hartono, H. ;
Soh, C. B. ;
Chow, S. Y. ;
Chua, S. J. ;
Fitzgerald, E. A. .
APPLIED PHYSICS LETTERS, 2007, 90 (17)