Soft X-ray and EUV emission from cryogenic liquid jets irradiated with fs, ps and ns-laser pulses

被引：2
|
作者：
Wieland, M [1 ]
Faubel, M [1 ]
Schmidt, M [1 ]
Vogt, U [1 ]
Wilhein, T [1 ]
机构：
[1] Univ Appl Sci, D-53424 Remagen, Germany
来源：
APPLICATIONS OF X RAYS GENERATED FROM LASERS AND OTHER BRIGHT SOURCES II | 2001年 / 4504卷
关键词：
laser generated plasma; laboratory soft X-ray source; EUV;
D O I：
10.1117/12.448479
中图分类号：
O43 [光学];
学科分类号：
070207 ; 0803 ;
摘要：
Cryogenic liquid jets of either nitrogen or argon of up to 30 pm in diameter were exposed to intense laser fields with pulse durations between 70 fs and 3 ns leading to intensities of 10(16) cm(-2) and 10(13) W cm(-2), respectively. The emission of extreme UV light and soft X-rays investigated by means of an absolutely calibrated soft X-ray spectrograph shows the characteristic lines of highly ionized nitrogen and argon atoms. For nitrogen the emitted photon flux at the longer pulse length was several orders of magnitude higher than for 70 fs pulses whereas for argon pulse durations around one ps lead to the highest conversion efficiency (CE) from laser to soft X-ray radiation.
引用
收藏
页码：62 / 68
页数：7
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