Calibration of angle artifacts and instruments using a high precision angle generator

被引:26
作者
Kim, Jong-Ahn [1 ]
Kim, Jae Wan [1 ]
Kang, Chu-Shik [1 ]
Jin, Jonghan [1 ]
Eom, Tae Bong [1 ]
机构
[1] Korea Res Inst Stand & Sci, Ctr Length, Taejon 305340, South Korea
关键词
Angle generator; Calibration; Angle artifact; Angle instrument; Uncertainty;
D O I
10.1007/s12541-013-0051-9
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Various angle artifacts and instruments are used in precision engineering, and their calibrations are important to ensure high accuracy and reliability in angle metrology. In this paper, we present uncertainty analysis and calibrations of several angle artifact and instruments to evaluate the performance of the high precision angle generator which is newly developed as the primary angle standard of Korea Research Institute of Standards and Science (KRISS). The configuration of the angle generator is explained shortly, which uses multiple ultrasonic motors and a self-calibratable encoder adopting the equal-division-averaged (EDA) method. The expanded uncertainty (k = 2) of the angle generator, which are mainly contributed by nonlinearity and scale error of a divided circle, was evaluated less than 0.03aEuro(3). The calibration result of a high precision angle encoder was compatible with that of manufacturer within the expanded uncertainty of calibration, 0.04aEuro(3). Using the calibration result of an electronic autocollimator, the nonlinearity error of the angle generator was analyzed and a calibration method is proposed to reduce the nonlinearity error related to the signal period of the divided circle. In the calibration of a 36-face optical polygon, we applied the complete closure method to obtain the error of the angle generator separately, and its magnitude was less than 0.015aEuro(3), which is less than half of the estimated uncertainty of the angle generator.
引用
收藏
页码:367 / 371
页数:5
相关论文
共 12 条
[1]  
Eom TB, 2007, INT J PRECIS ENG MAN, V8, P20
[2]   Uncertainty analysis for angle calibrations using circle closure [J].
Estler, WT .
JOURNAL OF RESEARCH OF THE NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY, 1998, 103 (02) :141-151
[3]   Calibration of angle encoders using transfer functions [J].
Geckeler, Ralf D. ;
Fricke, Andreas ;
Elster, Clemens .
MEASUREMENT SCIENCE AND TECHNOLOGY, 2006, 17 (10) :2811-2818
[4]  
ISO/IEC Guide 98-3:2008, 2008, UNC MEAS 3
[5]   Calibration of high-resolution electronic autocollimators against an angle comparator [J].
Just, A ;
Krause, M ;
Probst, R ;
Wittekopf, R .
METROLOGIA, 2003, 40 (05) :288-294
[6]   Comparison of angle standards with the aid of a high-resolution angle encoder [J].
Just, A. ;
Krause, M. ;
Probst, R. ;
Bosse, H. ;
Haunerdinger, H. ;
Spaeth, Ch. ;
Metz, G. ;
Israel, W. .
PRECISION ENGINEERING-JOURNAL OF THE INTERNATIONAL SOCIETIES FOR PRECISION ENGINEERING AND NANOTECHNOLOGY, 2009, 33 (04) :530-533
[7]  
Kim J.-A., 2011, P MACROSCALE 2011
[8]  
Kim Jong-Ahn, 2011, REV SCI INSTRUM, V82
[9]   The new PTB angle comparator [J].
Probst, R ;
Wittekopf, R ;
Krause, M ;
Dangschat, H ;
Ernst, A .
MEASUREMENT SCIENCE AND TECHNOLOGY, 1998, 9 (07) :1059-1066
[10]   Metrological errors in optical encoders [J].
Sanchez-Brea, Luis Miguel ;
Morlanes, Tomas .
MEASUREMENT SCIENCE AND TECHNOLOGY, 2008, 19 (11)