Detection of foreign bodies in grain with terahertz reflection imaging

被引：26
作者：
Jiang, Yuying [1 ,2 ,3 ]
Ge, Hongyi [2 ]
Zhang, Yuan [2 ,3 ]
机构：
[1] Henan Univ Technol, Minist Educ, Key Lab Grain Informat Proc & Control, Zhengzhou 450001, Henan, Peoples R China
[2] Henan Univ Technol, Coll Informat Sci & Engn, Zhengzhou 450001, Henan, Peoples R China
[3] Henan Univ Technol, Key Lab Henan Prov Grain Photoelect Detect & Cont, Zhengzhou 450001, Henan, Peoples R China
来源：
OPTIK | 2019年 / 181卷
基金：
中国国家自然科学基金;
关键词：
THz reflection imaging; Foreign bodies; Nondestructive detection; Grain;
D O I：
10.1016/j.ijleo.2018.12.066
中图分类号：
O43 [光学];
学科分类号：
070207 ; 0803 ;
摘要：
Foreign bodies embedded in grain are difficult to detect with conventional measurement methods. In this paper, terahertz time-domain spectroscopy (THz-TDS) reflection imaging is proposed as a non-destructive and deeply penetrating technique for detecting the foreign bodies found in wheat grain with different depths below the surface. Image preprocessing and threshold segment algorithm are employed to improve the THz images. In contrast to the behavior of wheat grains, foreign bodies embedded in flour are also detected and analyzed. The results indicate that the THz reflection imaging technology promises to be a useful tool for observing the presence of foreign bodies in grain.
引用
收藏
页码：1130 / 1138
页数：9
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