Identification of motion parameters from images produced by atomic force microscopy

被引：0
|
作者：
Sakyte, E. [1 ]
Saunoriene, L. [1 ]
Ragulskis, M. [1 ]
Maskeliunas, R. [2 ]
机构：
[1] Kaunas Univ Technol, LT-51368 Kaunas, Lithuania
[2] Vilnius Gediminas Tech Univ, LT-03224 Vilnius, Lithuania
来源：
JOURNAL OF VIBROENGINEERING | 2008年 / 10卷 / 02期
关键词：
atomic force microscopy; digital image; grating; inverse problem;
D O I：
暂无
中图分类号：
R318 [生物医学工程];
学科分类号：
0831 ;
摘要：
An experimental technique for analysis of pseudo-static oscillations of piezoelectric ceramics is presented in this paper. This technique is capable to detect both transverse and longitudinal oscillations and is based on the formation of observable grating modulated on the static surface of the scanned body. Mathematical and numerical models of the analyzed system comprising a scanning cantilever of atomic force microscope are presented in order to develop an experimental methodology to assess the frequency, transverse and longitudinal amplitudes of elliptic oscillations of the investigated systems.
引用
收藏
页码：184 / 190
页数：7
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