High-Performance GaN-Based Nanochannel FinFETs With/Without AlGaN/GaN Heterostructure

被引:96
|
作者
Im, Ki-Sik [1 ]
Won, Chul-Ho [1 ]
Jo, Young-Woo [1 ]
Lee, Jae-Hoon [1 ]
Bawedin, Maryline [2 ]
Cristoloveanu, Sorin [3 ]
Lee, Jung-Hee [4 ]
机构
[1] Kyungpook Natl Univ, Sch Elect Engn, Taegu 702201, South Korea
[2] Univ Montpellier 2, IES, F-34095 Montpellier, France
[3] Grenoble Polytech Inst, Inst Microelect Electromagnetism & Photon, F-38016 Grenoble, France
[4] Samsung Elect Co Ltd, Syst LSI, Discrete Dev Team, Giheung 446711, South Korea
基金
新加坡国家研究基金会;
关键词
2-D electron gas (2-DEG); AlGaN/GaN; fin-shaped field-effect transistor (FinFET); heterojunction; high-electron mobility transistor (HEMT); junctionless; MOSFET; nanochannel; triple gate;
D O I
10.1109/TED.2013.2274660
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Two types of fin-shaped field-effect transistors (FinFETs), one with AlGaN/GaN heterojunction and the other with heavily doped heterojunction-free GaN layer operating in junctionless mode, have been fabricated and characterized. The threshold voltages of both devices shift toward positive direction from large negative value as the fin width decreases. Both devices exhibit high ON-state performance. The heterojunction-free GaN FinFETs show superior OFF-state performance because the current flows through the volume of the GaN channel layer, which can be fully depleted. The proposed GaN nanochannel FinFETs are very promising candidates not only for high performance, but also for high power applications.
引用
收藏
页码:3012 / 3018
页数:7
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