Monte Carlo Semi-Empirical Model for Si(Li) X-Ray Detector: Differences between Nominal and Fitted Parameters

被引：3

作者：

Lopez-Pino, N. ^{[1
]}

Padilla-Cabal, F. ^{[1
]}

Garcia-Alvarez, J. A. ^{[1
]}

Vazquez, L. ^{[1
]}

D' Alessandro, K. ^{[1
]}

Correa-Alfonso, C. M. ^{[1
]}

Godoy, W. ^{[2
]}

Maidana, N. L. ^{[2
]}

Vanin, V. R. ^{[2
]}

机构：

[1] Inst Super Tecnol & Ciencias Aplicadas InSTEC, Dept Fis Nucl, Ave Salvador Allende & Luaces,AP 6163, Havana 10600, Cuba

[2] Univ Sao Paulo, Inst Fis, Lab Acelerador Linear, BR-05508900 Sao Paulo, Brazil

来源：

XXXV BRAZILIAN WORKSHOP ON NUCLEAR PHYSICS | 2013年 / 1529卷

关键词：

Si(Li) detector; efficiency; Monte Carlo; EFFICIENCY; SIMULATION;

D O I：

10.1063/1.4804104

中图分类号：

O57 [原子核物理学、高能物理学];

学科分类号：

070202 ;

摘要：

A detailed characterization of a X-ray Si(Li) detector was performed to obtain the energy dependence of efficiency in the photon energy range of 6.4 - 59.5 keV, which was measured and reproduced by Monte Carlo (MC) simulations. Significant discrepancies between MC and experimental values were found when the manufacturer parameters of the detector were used in the simulation. A complete Computerized Tomography (CT) detector scan allowed to find the correct crystal dimensions and position inside the capsule. The computed efficiencies with the resulting detector model differed with the measured values no more than 10 % in most of the energy range.

引用

页码：134 / 136

页数：3

共 5 条

[1]

Be M.-M., 2004, Monographie BIPM-5 - Table of Radionuclides, V2

[2] Efficiency simulation of HPGe and Si(Li) detectors in γ- and X-ray spectroscopy [J].

Karamanis, D .

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT, 2003, 505 (1-2) :282-285

[3] Experimental characterization and Monte Carlo simulation of Si(Li) detector efficiency by radioactive sources and PIXE [J].

Mesradi, M. ;

Elanique, A. ;

Nourreddine, A. ;

Pape, A. ;

Raiser, D. ;

Sellam, A. .

APPLIED RADIATION AND ISOTOPES, 2008, 66 (6-7) :780-785

[4]

Pelowitz D., 2005, LACP050369 LOS ALM N

[5] Measurement of detection efficiency and response functions for an Si(Li) x-ray spectrometer in the range 0.1-5 keV [J].

Scholze, F ;

Procop, M .

X-RAY SPECTROMETRY, 2001, 30 (02) :69-76

← 1 →