A Low Close-In Phase Noise Class-C Differential Clapp VCO Topology in 180 nm Si-Ge HBT Technology

被引:0
|
作者
Macera, Giuseppe [1 ]
Marotta, Valerio [2 ]
机构
[1] Analog Devices Inc Raheen, Limerick, Ireland
[2] Tyndall Natl Inst, Cork, Ireland
来源
2017 28TH IRISH SIGNALS AND SYSTEMS CONFERENCE (ISSC) | 2017年
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中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
This paper reports a new improved Clapp VCO topology designed in 180 nm Si-Ge HBT technology for operations around 5 GHz. The designed topology uses a series-tuned resonator, a back-to-back series varactor configuration for tuning the output frequency and a filtering tail current designed for shunting to ground the second harmonic noise component. At the supply voltage of 3.3V, and across Process, Voltage and Temperature (PVT), the resulting VCO exhibits a very low phase noise (-113 dBc/Hz at 100 kHz offset from the carrier frequency), a high tuning range (25%), a power consumption of 6 mW and a Tuning Range based Figure Of Merit (FOM) equal to 211 dB, classifying itself as a challenging VCO and suggesting the opportunity to be considered for further investigations and implementations in Si-Ge HBT Technology.
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页数:5
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