Integration of GaInP/GaAs heterojunction bipolar transistors and high electron mobility transistors

被引:18
|
作者
Yang, YF [1 ]
Hsu, CC [1 ]
Yang, ES [1 ]
机构
[1] CHINESE UNIV HONG KONG,DEPT ELECT ENGN,HONG KONG,HONG KONG
基金
美国国家科学基金会;
关键词
D O I
10.1109/55.506368
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Integration of carbon-doped GaInP/GaAs heterojunction bipolar transistors (HBT's) and high electron mobility transistors (HEMT's) is demonstrated by growing an HBT on the top of a HEMT. A current gain of 60, a cutoff frequency of 59 GHz and a maximum oscillation frequency of 68 GHz were obtained for a 5 x 15 mu m(2) self-aligned HBT. The HEMT with a gate length of 1.5 mu m has a transconductance of 210 mS/mm, a cutoff frequency of 9 GHz and a maximum oscillation frequency of 22 GHz. It is shown that the GaInP/GaAs HBT on the HEMT is a simple Bi-FET technology suitable for microwave and mixed signal applications.
引用
收藏
页码:363 / 365
页数:3
相关论文
共 50 条
  • [1] Integration of GaInP/GaAs heterojunction bipolar transistors and high electron mobility transistors
    Columbia Univ, New York, United States
    IEEE Electron Device Lett, 7 (363-365):
  • [2] Excess noise reduction in GaInP/GaAs heterojunction bipolar transistors
    Plana, R
    vanHaaren, B
    Escotte, L
    Delage, SL
    Blanck, H
    IEEE ELECTRON DEVICE LETTERS, 1997, 18 (03) : 108 - 110
  • [3] Emitter pedestal design of GaInP/GaAs heterojunction bipolar transistors
    Lopez-Gonzalez, Juan M.
    2007 Spanish Conference on Electron Devices, Proceedings, 2007, : 348 - 350
  • [4] Avalanche multiplication in GaInP/GaAs single heterojunction bipolar transistors
    Flitcroft, RM
    David, JPR
    Houston, PA
    Button, CC
    IEEE TRANSACTIONS ON ELECTRON DEVICES, 1998, 45 (06) : 1207 - 1212
  • [5] COMPARISON OF GAINP/GAAS HETEROSTRUCTURE-EMITTER BIPOLAR-TRANSISTORS AND HETEROJUNCTION BIPOLAR-TRANSISTORS
    YANG, YF
    HSU, CC
    YANG, ES
    CHEN, YK
    IEEE TRANSACTIONS ON ELECTRON DEVICES, 1995, 42 (07) : 1210 - 1215
  • [6] On the short and long term degradation of GaInP/GaAs heterojunction bipolar transistors
    Borgarino, M
    Plana, R
    Delage, S
    Fantini, F
    Graffeuil, J
    MICROELECTRONICS RELIABILITY, 1999, 39 (12) : 1823 - 1832
  • [7] Correlation of photoreflectance spectra with performance of GaInP/GaAs heterojunction bipolar transistors
    Hsin, Y.-M. (yhsin@ee.ncu.edu.tw), 1600, (Japan Society of Applied Physics):
  • [8] CURRENT TRANSPORT MECHANISM IN GAINP/GAAS HETEROJUNCTION BIPOLAR-TRANSISTORS
    LIU, W
    FAN, SK
    KIM, TS
    BEAM, EA
    DAVITO, DB
    IEEE TRANSACTIONS ON ELECTRON DEVICES, 1993, 40 (08) : 1378 - 1383
  • [9] Assessment of layer structures for GaInP/GaAs-heterojunction bipolar transistors
    Richter, E
    Brunner, F
    Gramlich, S
    Hähle, S
    Mai, M
    Zeimer, U
    Weyers, M
    MATERIALS SCIENCE AND ENGINEERING B-SOLID STATE MATERIALS FOR ADVANCED TECHNOLOGY, 1999, 66 (1-3): : 162 - 173
  • [10] Influence of geometry and passivation on noise in GaInP/GaAs heterojunction bipolar transistors
    Delseny, C
    Mourier, Y
    Pascal, F
    Jarrix, S
    Lecoy, G
    JOURNAL OF APPLIED PHYSICS, 1998, 84 (05) : 2735 - 2739