Experimental verification of effects of barrier dopings on the internal electric fields and the band structure in InGaN/GaN light emitting diodes

被引:10
|
作者
Song, Jung-Hoon [1 ]
Kim, Tae-Soo [1 ]
Park, Ki-Nam [1 ]
Lee, Jin-Gyu [1 ]
Hong, Soon-Ku [2 ]
Cho, Sung-Royng [3 ]
Lee, Seogwoo [3 ]
Cho, Meoung Whan [3 ]
机构
[1] Kongju Natl Univ, Dept Phys, Kong Ju 314701, Chungnam, South Korea
[2] Chungnam Natl Univ, Dept Adv Mat Engn, Taejon 305764, South Korea
[3] Wasvesquare Co Inc, Yongin 449863, Gyeonggi, South Korea
基金
新加坡国家研究基金会;
关键词
MULTIPLE-QUANTUM WELLS; PIEZOELECTRIC FIELD; POLARIZATION-FIELD; ELECTROREFLECTANCE;
D O I
10.1063/1.4870256
中图分类号
O59 [应用物理学];
学科分类号
摘要
We experimentally clarify the effects of barrier dopings on the polarization induced electric fields and the band structure in InGaN/GaN blue light emitting diodes. Both effects were independently verified by using electric field modulated reflectance and capacitance-voltage measurement. It is shown that the Si barrier doping does reduce the polarization induced electric field in the quantum wells. But the benefit of Si-doping is nullified by modification of the band structure and depletion process. With increased number of doped barriers, smaller number of quantum wells remains in the depletion region at the onset of the diffusion process, which can reduce the effective active volume and enhance the electron overflow. (C) 2014 AIP Publishing LLC.
引用
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页数:4
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