In-line interferometric femtosecond stimulated Raman scattering spectroscopy

被引：9
|
作者：
Dobner, Sven [1 ]
Gross, Petra [2 ]
Fallnich, Carsten [1 ]
机构：
[1] Univ Munster, Inst Appl Phys, D-48149 Munster, Germany
[2] Carl von Ossietzky Univ Oldenburg, Inst Phys, D-26129 Oldenburg, Germany
来源：
JOURNAL OF CHEMICAL PHYSICS | 2013年 / 138卷 / 24期
关键词：
INSTRUMENTATION; SENSITIVITY;
D O I：
10.1063/1.4811486
中图分类号：
O64 [物理化学（理论化学）、化学物理学];
学科分类号：
070304 ; 081704 ;
摘要：
We present in-line interferometric femtosecond stimulated Raman scattering (II-FSRS), a new method to measure the spectral Raman intensity and phase over a broad spectral range, potentially in a single shot. An analytic model is developed, that excellently reproduces the measured spectra. Additionally, the performance of II-FSRS is directly compared in experiments to two established techniques, namely femtosecond stimulated Raman scattering and femtosecond Raman induced Kerr-effect spectroscopy. (C) 2013 AIP Publishing LLC.
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页数：8
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