Application of electrochemical atomic force microscopy

被引：0
作者：
Li, XJ
He, PG
Fang, YX [1 ]
Hu, J
Li, MQ
机构：
[1] E China Normal Univ, Dept Chem, Shanghai 200062, Peoples R China
[2] Chinese Acad Sci, Shanghai Inst Nucl Res, Shanghai 201800, Peoples R China
来源：
CHINESE JOURNAL OF ANALYTICAL CHEMISTRY | 2004年 / 32卷 / 03期
关键词：
electrochemical atomic force microscopy; in-situ analysis; surface analysis; electrostatic force; review;
D O I：
暂无
中图分类号：
O65 [分析化学];
学科分类号：
070302 ; 081704 ;
摘要：
The principle and technique of electrochemical atomic force microscopy(EC-AFM) are briefly surveyed. The application of in-situ AFM in electrochemistry and electroanalytical chemistry is critically evaluated, such as observing the process of electrodeposition, corrosion and anti-corrosion, observing the process and properties of film formed by electrodeposition, measuring the electrostatic force between two surfaces and so on. It also describes the integrated EC-AFM.
引用
收藏
页码：395 / 401
页数：7
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